Journal of Synthetic Crystals ›› 2026, Vol. 55 ›› Issue (4): 546-565.DOI: 10.16553/j.cnki.issn1000-985x.2025.0249
• Reviews • Previous Articles Next Articles
REN Guozhao1(
), CHEN Liangxian1(
), AN Kang1,2, LIU Yuchen1, XIE Chengdong1, HUANG Ke1, HU Yaobin1, LIU Jinlong1, WEI Junjun1, LI Chengming1(
)
Received:2025-12-10
Online:2026-04-20
Published:2026-05-19
Contact:
CHEN Liangxian, LI Chengming
CLC Number:
REN Guozhao, CHEN Liangxian, AN Kang, LIU Yuchen, XIE Chengdong, HUANG Ke, HU Yaobin, LIU Jinlong, WEI Junjun, LI Chengming. Research Progress of 915 MHz MPCVD Devices and Its Diamond Film Deposition[J]. Journal of Synthetic Crystals, 2026, 55(4): 546-565.
Fig.1 Four simulation diagrams of electric field distribution and schematic diagram of chamber structure for the 915 MHz MPCVD device. (a) Elliptical shape[23]; (b) feedback type at the upper end of the ring antenna shape[24]; (c) feedback type at the lower end of the ring antenna shape[17]; (d), (e) iplas ring shape[12]
Devices with different structure | Microwave coupling and transmission | Plasma uniformity | Continuous reliability | Characteristics of diamond production |
|---|---|---|---|---|
| Elliptical shape | The path is clear and relies on the geometric focus of the cavity. The bottleneck lies in the physical limit of the energy transmission medium (the quartz bell jar) | Spherical plasma can easily achieve high quality in a small area. However, when the area expands, the temperature and concentration gradient of active groups at the edge and the center will intensify, resulting in a decrease in uniformity | The heat load concentration point is at the quartz window | The quality of the diamond film is excellent |
| Ring antenna shape | Separate the energy coupling point from the plasma excitation zone. The fundamental advantage is that it decouples the contradiction between high-power microwave input and vacuum sealing/medium etching. The bottleneck depends on the sealing reliability of the mechanical structure | It is more conducive to radial expansion, but it also leads to more complex flow field and temperature field distributions. The large-area uniformity is highly dependent on the collaborative optimization of the cavity, base platform and airflow design | The heat load concentration point is in the sealing structure | The device has high power and a large preparation area |
| Slit coupling shape | By implementing distributed and multi-point coupling to optimize the efficiency and uniformity of energy injection, the essence lies in pursuing the limits of plasma parameters | The goal is to overcome the uniformity issue through high density and stability. However, thermal management and control of gas-phase chemical reactions become extremely complex under extremely high-power conditions | The point of concentrated heat load is the entire reactor chamber wall and the antenna | High sedimentation rate and good overall stability |
Table 1 Comparison of advantages and disadvantages of 915 MHz MPCVD devices with different structures
Devices with different structure | Microwave coupling and transmission | Plasma uniformity | Continuous reliability | Characteristics of diamond production |
|---|---|---|---|---|
| Elliptical shape | The path is clear and relies on the geometric focus of the cavity. The bottleneck lies in the physical limit of the energy transmission medium (the quartz bell jar) | Spherical plasma can easily achieve high quality in a small area. However, when the area expands, the temperature and concentration gradient of active groups at the edge and the center will intensify, resulting in a decrease in uniformity | The heat load concentration point is at the quartz window | The quality of the diamond film is excellent |
| Ring antenna shape | Separate the energy coupling point from the plasma excitation zone. The fundamental advantage is that it decouples the contradiction between high-power microwave input and vacuum sealing/medium etching. The bottleneck depends on the sealing reliability of the mechanical structure | It is more conducive to radial expansion, but it also leads to more complex flow field and temperature field distributions. The large-area uniformity is highly dependent on the collaborative optimization of the cavity, base platform and airflow design | The heat load concentration point is in the sealing structure | The device has high power and a large preparation area |
| Slit coupling shape | By implementing distributed and multi-point coupling to optimize the efficiency and uniformity of energy injection, the essence lies in pursuing the limits of plasma parameters | The goal is to overcome the uniformity issue through high density and stability. However, thermal management and control of gas-phase chemical reactions become extremely complex under extremely high-power conditions | The point of concentrated heat load is the entire reactor chamber wall and the antenna | High sedimentation rate and good overall stability |
Comparison of TM0n mode under different devices | Ellipsoidal resonant cavity (dominated by TM0n mode) | Ring coupling shape resonant cavity (TM01/TM02 hybrid mode) |
|---|---|---|
Core design feature | Utilizing the geometric focusing of microwaves on an ellipsoidal surface, the energy is directly coupled to the reaction zone through the medium window (the quartz cover) | By using a surrounding metal antenna structure to radiate and couple microwaves, the plasma region is physically isolated from the microwave feeding point by the vacuum wall |
| Typical working mode | TM0n (n=1,2,3,…) has a simple mode (such as TM01/TM02), and the electric field is symmetrically distributed along the axial direction | TM01 and TM02 and other multi-mode combinations are mixed. The cavity design allows several axial modes to coexist, thereby expanding the plasma volume |
Electric field distribution characteristic | The electric field resonantly intensifies between the two foci of the ellipsoid, with the energy highly concentrated in the smaller area near the lower focus, forming a strong excitation field | The electric field exhibits multiple maximum value regions radially (such as near the axis and the cavity wall), with a more extensive distribution, which is conducive to large-scale expansion |
Plasma characteristic | Shape: Usually forms symmetrical spherical or ellipsoid plasma spheres Advantages: High energy density in the central region, good symmetry, conducive to obtaining high-quality diamond Challenge: The edge of the plasma ball has a large gradient, and when conducting large-scale deposition, the control of film thickness and quality uniformity becomes a core problem | Shape: can form ring-shaped, cap-shaped, or large-area disc-shaped plasmas Advantages: good radial expansion of electric field, naturally more suitable for uniform coverage of large substrates Challenges: the shape and position of the plasma are sensitive to tuning, and precise matching is required to maintain stability |
Power range and applicable scenario | Power range: Limited by quartz window etching and heat dissipation, traditional designs are typically <60 kW; modern improved models can have higher power Application scenarios: Most suitable for applications that aim for extreme crystal quality, such as epitaxial growth of single-crystal diamond at the electronic device level | Power range: the design of separating the antenna from the window avoids etching issues and can handle extremely high power (typically >75 kW, up to over 150 kW) Application scenarios: it is designed for high-power, large-area, and high-speed deposition, and is the mainstream industrial choice for large-sized polycrystalline diamond thick films and synthetic diamond production |
Technological difficulty | The energy density at the focal point under high power can easily exceed the thermal and corrosion resistance limits of the quartz window, thus becoming the main physical limitation for power increase | The long-term reliability of the high-vacuum sealing between the antenna structure and the cavity, as well as the complex tuning control of the multi-mode field and the plasma interaction |
Table 2 Comparison of typical performance of TM0mn mode in different 915 MHz MPCVD
Comparison of TM0n mode under different devices | Ellipsoidal resonant cavity (dominated by TM0n mode) | Ring coupling shape resonant cavity (TM01/TM02 hybrid mode) |
|---|---|---|
Core design feature | Utilizing the geometric focusing of microwaves on an ellipsoidal surface, the energy is directly coupled to the reaction zone through the medium window (the quartz cover) | By using a surrounding metal antenna structure to radiate and couple microwaves, the plasma region is physically isolated from the microwave feeding point by the vacuum wall |
| Typical working mode | TM0n (n=1,2,3,…) has a simple mode (such as TM01/TM02), and the electric field is symmetrically distributed along the axial direction | TM01 and TM02 and other multi-mode combinations are mixed. The cavity design allows several axial modes to coexist, thereby expanding the plasma volume |
Electric field distribution characteristic | The electric field resonantly intensifies between the two foci of the ellipsoid, with the energy highly concentrated in the smaller area near the lower focus, forming a strong excitation field | The electric field exhibits multiple maximum value regions radially (such as near the axis and the cavity wall), with a more extensive distribution, which is conducive to large-scale expansion |
Plasma characteristic | Shape: Usually forms symmetrical spherical or ellipsoid plasma spheres Advantages: High energy density in the central region, good symmetry, conducive to obtaining high-quality diamond Challenge: The edge of the plasma ball has a large gradient, and when conducting large-scale deposition, the control of film thickness and quality uniformity becomes a core problem | Shape: can form ring-shaped, cap-shaped, or large-area disc-shaped plasmas Advantages: good radial expansion of electric field, naturally more suitable for uniform coverage of large substrates Challenges: the shape and position of the plasma are sensitive to tuning, and precise matching is required to maintain stability |
Power range and applicable scenario | Power range: Limited by quartz window etching and heat dissipation, traditional designs are typically <60 kW; modern improved models can have higher power Application scenarios: Most suitable for applications that aim for extreme crystal quality, such as epitaxial growth of single-crystal diamond at the electronic device level | Power range: the design of separating the antenna from the window avoids etching issues and can handle extremely high power (typically >75 kW, up to over 150 kW) Application scenarios: it is designed for high-power, large-area, and high-speed deposition, and is the mainstream industrial choice for large-sized polycrystalline diamond thick films and synthetic diamond production |
Technological difficulty | The energy density at the focal point under high power can easily exceed the thermal and corrosion resistance limits of the quartz window, thus becoming the main physical limitation for power increase | The long-term reliability of the high-vacuum sealing between the antenna structure and the cavity, as well as the complex tuning control of the multi-mode field and the plasma interaction |
Fig.3 Simulation results of microwave electric field[17]. (a) Microwave electric field; (b) reduction electric field; (c) electron density; (d) gas temperature distribution; (e) calculation of microwave electric field without considering plasma excitation
Fig.4 915 MHz ellipsoidal reaction device system (a)[23] raw diamond disks with 2, 3, 4, and 6 in. diameter (unpolished, still attached to the silicon substrate) (b)[45]
Fig.5 Nucleation side (a) and growth side (b) optical micrographs of a 100 mm diameter free-standing diamond wafer prepared using a 915 MHz system[42]
Fig.6 DiamoTek 1800 device and the schematic diagram of depositing diamond film[50]. (a) 915 MHz MPCVD system operating in the cleanroom at the ANL Center for Nanoscale Materials; photographs of a 150 mm diameter Si wafer (b) and a 200 mm diameter Si-CMOS wafer (c) with UNCD films grown at 400 ℃
Fig.7 Photographs of differences in grain size of diamond films of different sizes and in various deposition areas[52]. The diamond films deposited on the substrates with diameters of 51 mm (a),(b), 25 mm (c),(d) and 152 mm (e) show the SEM images of the 152 mm diameter diamond films at the center (f), the middle (g) and the edge (h)
Fig.8 Hebei Priceman jointly developed the 915 MHz MPCVD equipment (a) with Beijing University of Science and Technology, and also produced the 3~5 inch diamond film (b) deposited by this equipment[17]
Team/ Organization | Device design features | Publicly available performance data | The stage ofcore technology development |
|---|---|---|---|
Gemany Fraunhofer IWs | Ellipsoidal resonant cavity type. Utilizes a unique ellipsoidal cavity for microwave focusing, and the plasma position remains stabie | It demonstrated the ability to fabri cate 6 inch diamond wafers. However, detailed process data such as specific growth rates and uniformity have not been fully disclosed in academic literature | Principle verification and high-end applications. Focusing on the principle-based preparation of high-quality, large-sized diamond films, providing a material foundation for high-end applications such as optics and windows |
| America ASTEX/Japan Seki | Ring antenna type (multi-mode non-cylindrical cavity). It adopts an integrated design of ring quartz window and antenna/base.separating plasma from the window, and has high power carrying capacity | Using a 60 kW device, the research focused on the crystal orientation and morphology control techniques for 152 mm large-area diamond films | Process development and single crystal preparation. Focus on the research of deposition processes for industrialization, especially the preparation technology of large-sized single crystal diamond |
| Germany iplas | Slit coupling type. Utilizing a patented microwave coupling structure, it aims to achieve stable plasma under high pressure and high power density conditions | It is claimed that a diamond film with a diameter of 200 mm can be fabricated, The specific process parameters and quality data of the film are classified as trade secrets, and there are very few published academic research papers on this topic | Advanced process and equipment commercialization. Pursuing the technological limits under extremely high power and pressure. Commercialization of the equipment, but the technical details are kept confidential |
USTB(University of Science and Technology Beijing) | Ring antenna type. The independently developed cylindrical cavity and stepped ring antenna design takes into account both high power capacity and cavity sealing reliability | Using a 75 kW device, 3-5 inch crack-free self-supporting diamond films were successfully prepared. and the thickness uniformity (deviation) was approximately ±4% for the 3 -inch area and + 8% for the 5-inch area | Self-contained equipment and process integration. We have achieved a complete technological breakthrough covering the entire chain from reactor design. simulation. equipment construction to the high-quality production of diamond films |
HIT(Harbin Institute of Technology) | Ring antenna type (the specific design is not disclosed). Utilizes a self-developed 915 MHz/75 kW MPCVD device | The 8-inch (approximately 200 mm) (111) oriented diamond epitaxial film was successfully prepared, and the influence of deposition temperature on the crystalline quality and uniformity was studied | Exploration of ultra-large size technology. Dedicated to promoting the application of diamond films to larger sizes (8 inches) and systematically studying the corresponding processes |
Hebei Presman/USTB | Ring antenna type (derivative design). We adopted the developed 915 MHz/75 kW MPCVD equipment | A 127 mm (5 inches) diameter and 1 mm thick optical-grade diamond window material was prepared, with an optical transmittance close to the theoretical value | Engineering and productization. Focusing on the engineering production of optical-grade diamond window products, it has achieved the transformation from technology to product |
Table 3 Research status of 915 MHz MPCVD equipment by domestic and foreign research institutions
Team/ Organization | Device design features | Publicly available performance data | The stage ofcore technology development |
|---|---|---|---|
Gemany Fraunhofer IWs | Ellipsoidal resonant cavity type. Utilizes a unique ellipsoidal cavity for microwave focusing, and the plasma position remains stabie | It demonstrated the ability to fabri cate 6 inch diamond wafers. However, detailed process data such as specific growth rates and uniformity have not been fully disclosed in academic literature | Principle verification and high-end applications. Focusing on the principle-based preparation of high-quality, large-sized diamond films, providing a material foundation for high-end applications such as optics and windows |
| America ASTEX/Japan Seki | Ring antenna type (multi-mode non-cylindrical cavity). It adopts an integrated design of ring quartz window and antenna/base.separating plasma from the window, and has high power carrying capacity | Using a 60 kW device, the research focused on the crystal orientation and morphology control techniques for 152 mm large-area diamond films | Process development and single crystal preparation. Focus on the research of deposition processes for industrialization, especially the preparation technology of large-sized single crystal diamond |
| Germany iplas | Slit coupling type. Utilizing a patented microwave coupling structure, it aims to achieve stable plasma under high pressure and high power density conditions | It is claimed that a diamond film with a diameter of 200 mm can be fabricated, The specific process parameters and quality data of the film are classified as trade secrets, and there are very few published academic research papers on this topic | Advanced process and equipment commercialization. Pursuing the technological limits under extremely high power and pressure. Commercialization of the equipment, but the technical details are kept confidential |
USTB(University of Science and Technology Beijing) | Ring antenna type. The independently developed cylindrical cavity and stepped ring antenna design takes into account both high power capacity and cavity sealing reliability | Using a 75 kW device, 3-5 inch crack-free self-supporting diamond films were successfully prepared. and the thickness uniformity (deviation) was approximately ±4% for the 3 -inch area and + 8% for the 5-inch area | Self-contained equipment and process integration. We have achieved a complete technological breakthrough covering the entire chain from reactor design. simulation. equipment construction to the high-quality production of diamond films |
HIT(Harbin Institute of Technology) | Ring antenna type (the specific design is not disclosed). Utilizes a self-developed 915 MHz/75 kW MPCVD device | The 8-inch (approximately 200 mm) (111) oriented diamond epitaxial film was successfully prepared, and the influence of deposition temperature on the crystalline quality and uniformity was studied | Exploration of ultra-large size technology. Dedicated to promoting the application of diamond films to larger sizes (8 inches) and systematically studying the corresponding processes |
Hebei Presman/USTB | Ring antenna type (derivative design). We adopted the developed 915 MHz/75 kW MPCVD equipment | A 127 mm (5 inches) diameter and 1 mm thick optical-grade diamond window material was prepared, with an optical transmittance close to the theoretical value | Engineering and productization. Focusing on the engineering production of optical-grade diamond window products, it has achieved the transformation from technology to product |
Fig.10 Optical photograph of a 150 mm diameter diamond film attached to a silicon substrate, and comparison of grain differences at the center (b), middle (c) and edge (d) positions of the diamond film grown at 915 MHz[62]
Fig.12 (a) Photograph of a typical 3 mm thick, 5 inch free-standing polycrystalline diamond wafer grown by the cyclic nitrogen doping process; (b) SEM image of the diamond wafer, showing a pyramidal surface morphology (indicated by dashed lines)[76]
Process parameter | General influence laws of diamond films (SCD, MCD, NCD) | Challenges and new issues at 915 MHz | Corresponding process solutions |
|---|---|---|---|
| Microwave power | SCD/MCD:ower ↑, growth rate ↑, grain size ↑, but excessive power leads to defect ↑ and thermal stress ↑ NCD:sensitive to power, requires medium to low power to maintain nanocrystalline nucleation | The large volume of plasma results in low power density, and it is difficult to control the uniformity of the large-area temperature field. The edges are prone to becoming overly cold or overly hot | Active cooling/heating of the base: utilizes multi-zone temperature control Optimized coupling: achieves more uniform energy injection through tuning Power and pressure synergy: increases power density while maintaining the plasma volume |
| Pressure | SCD/MCD:pressure ↑, growth rate ↑, but the grains may become smaller and there may be amorphous carbon NCD:it is often necessary to apply a high pressure (greater than 10 kPa) to maintain a high nucleation density | High pressure will compress the plasma sphere, weakening the area advantage of 915 MHz; at the same time, it will change the transport paths of gaseous chemical species, affecting uniformity | Optimize the airflow field: design special gas nozzles to achieve laminar flow Select between “low pressure large area” or “high pressure small area” modes Dynamic pressure adjustment: adjust segmentally during the growth process |
| Temperature | SCD:strict temperature range (~800-1 000 ℃), temperature determines the growth advantage of crystal planes MCD:wide range(700-1 100 ℃) NCD:lower level(<600 ℃) | The radial temperature gradient on the large substrate is significant, resulting in an enormous difference in membrane structure, stress, and growth rate between the edge and the center | Base material and structure design: use high thermal conductivity materials (such as molybdenum, copper) and optimize the heat sink Auxiliary heating: install auxiliary heaters at the edges or back of the base Plasma shaping: make the distribution of the plasma heat source more compatible with the substrate |
| Gas flow rate | CH4/H2 ratio: determines growth rate and film quality (parameter α) Added gas: N2 (promotes <111> texture, affects color centers), O2/Ar (affects nucleation, etching amorphous carbon) Total flow rate: affects boundary layer thickness and growth rate | The transport pathways of gaseous chemical species are long, and the active groups are prone to undergo recombination or side reactions before reaching the substrate edge, which leads to an intensified edge effect (uneven composition and morphology) | Zone gas supply: different components or flow rates of air are provided for the center and the periphery High-speed sweeping flow: increase the total flow rate, thin the boundary layer, but balance uniformity and gas utilization efficiency Optimize nozzle design: make the airflow more in line with the shape of the plasma |
| Substrate and deposition platform | Substrate material: silicon (the most used), molybdenum, iridium (used for hetero-epitaxial SCD) Base height/shape: affects plasma coupling, heat conduction, and airflow | The problem of thermal deformation of large-area substrates is prominent; the influence of the base geometry on the stability of large-area plasma is magnified; the distortion of the electric field/flow field at the edge | Base corner rounding / edge optimization: reduces edge electric field and heat flow concentration Substrate bonding technology: utilizes high-temperature solder or graphite foil to improve thermal contact Base elevation and rotation: dynamically adjusts position to optimize uniformity |
Table 4 SCD, MCD and NCD process parameters, as well as their problems and solutions at 915 MHz
Process parameter | General influence laws of diamond films (SCD, MCD, NCD) | Challenges and new issues at 915 MHz | Corresponding process solutions |
|---|---|---|---|
| Microwave power | SCD/MCD:ower ↑, growth rate ↑, grain size ↑, but excessive power leads to defect ↑ and thermal stress ↑ NCD:sensitive to power, requires medium to low power to maintain nanocrystalline nucleation | The large volume of plasma results in low power density, and it is difficult to control the uniformity of the large-area temperature field. The edges are prone to becoming overly cold or overly hot | Active cooling/heating of the base: utilizes multi-zone temperature control Optimized coupling: achieves more uniform energy injection through tuning Power and pressure synergy: increases power density while maintaining the plasma volume |
| Pressure | SCD/MCD:pressure ↑, growth rate ↑, but the grains may become smaller and there may be amorphous carbon NCD:it is often necessary to apply a high pressure (greater than 10 kPa) to maintain a high nucleation density | High pressure will compress the plasma sphere, weakening the area advantage of 915 MHz; at the same time, it will change the transport paths of gaseous chemical species, affecting uniformity | Optimize the airflow field: design special gas nozzles to achieve laminar flow Select between “low pressure large area” or “high pressure small area” modes Dynamic pressure adjustment: adjust segmentally during the growth process |
| Temperature | SCD:strict temperature range (~800-1 000 ℃), temperature determines the growth advantage of crystal planes MCD:wide range(700-1 100 ℃) NCD:lower level(<600 ℃) | The radial temperature gradient on the large substrate is significant, resulting in an enormous difference in membrane structure, stress, and growth rate between the edge and the center | Base material and structure design: use high thermal conductivity materials (such as molybdenum, copper) and optimize the heat sink Auxiliary heating: install auxiliary heaters at the edges or back of the base Plasma shaping: make the distribution of the plasma heat source more compatible with the substrate |
| Gas flow rate | CH4/H2 ratio: determines growth rate and film quality (parameter α) Added gas: N2 (promotes <111> texture, affects color centers), O2/Ar (affects nucleation, etching amorphous carbon) Total flow rate: affects boundary layer thickness and growth rate | The transport pathways of gaseous chemical species are long, and the active groups are prone to undergo recombination or side reactions before reaching the substrate edge, which leads to an intensified edge effect (uneven composition and morphology) | Zone gas supply: different components or flow rates of air are provided for the center and the periphery High-speed sweeping flow: increase the total flow rate, thin the boundary layer, but balance uniformity and gas utilization efficiency Optimize nozzle design: make the airflow more in line with the shape of the plasma |
| Substrate and deposition platform | Substrate material: silicon (the most used), molybdenum, iridium (used for hetero-epitaxial SCD) Base height/shape: affects plasma coupling, heat conduction, and airflow | The problem of thermal deformation of large-area substrates is prominent; the influence of the base geometry on the stability of large-area plasma is magnified; the distortion of the electric field/flow field at the edge | Base corner rounding / edge optimization: reduces edge electric field and heat flow concentration Substrate bonding technology: utilizes high-temperature solder or graphite foil to improve thermal contact Base elevation and rotation: dynamically adjusts position to optimize uniformity |
| [1] | SCHWANDER M, PARTES K. A review of diamond synthesis by CVD processes[J]. Diamond and Related Materials, 2011, 20(9): 1287-1301. |
| [2] | 李成明, 陈良贤, 刘金龙, 等. 直流电弧等离子体喷射法制备金刚石自支撑膜研究新进展[J]. 金刚石与磨料磨具工程, 2018, 38(1): 16-27. |
| LI C M, CHEN L X, LIU J L, et al. Recent progress of free-standing diamond films prepared by DC arc plasma jet method[J]. Diamond & Abrasives Engineering, 2018, 38(1): 16-27 (in Chinese). | |
| [3] | 李成明, 任飞桐, 邵思武, 等. 化学气相沉积(CVD)金刚石研究现状和发展趋势[J]. 人工晶体学报, 2022, 51(5): 759-780. |
| LI C M, REN F T, SHAO S W, et al. Progress of chemical vapor deposition(CVD) diamond[J]. Journal of Synthetic Crystals, 2022, 51(5): 759-780 (in Chinese). | |
| [4] | 刘金龙, 安 康, 陈良贤, 等. CVD金刚石自支撑膜的研究进展[J]. 表面技术, 2018, 47(4): 1-10. |
| LIU J L, AN K, CHEN L X, et al. Research progress of freestanding CVD diamond films[J]. Surface Technology, 2018, 47(4): 1-10 (in Chinese). | |
| [5] | WENG J, LIU F, XIONG L W, et al. Deposition of large area uniform diamond films by microwave plasma CVD[J]. Vacuum, 2018, 147: 134-142. |
| [6] | TANG C J, FERNANDES A J S, JIANG X F, et al. Impact of high microwave power on hydrogen impurity trapping in nanocrystalline diamond films grown with simultaneous nitrogen and oxygen addition into methane/hydrogen plasma[J]. Journal of Crystal Growth, 2016, 434: 36-41. |
| [7] | TACHIBANA T, ANDO Y, WATANABE A, et al. Diamond films grown by a 60-kW microwave plasma chemical vapor deposition system[J]. Diamond and Related Materials, 2001, 10(9/10): 1569-1572. |
| [8] | AN K, ZHANG S, SHAO S W, et al. Effects of the electric field at the edge of a substrate to deposit a ϕ 100 mm uniform diamond film in a 2.45 GHz MPCVD system[J]. Plasma Science and Technology, 2022, 24(4): 045502. |
| [9] | DOLLET A. Multiscale modeling of CVD film growth: a review of recent works[J]. Surface and Coatings Technology, 2004, 177: 245-251. |
| [10] | MALLIK A K, BYSAKH S, SREEMANY M, et al. Property mapping of polycrystalline diamond coatings over large area[J]. Journal of Advanced Ceramics, 2014, 3(1): 56-70. |
| [11] | LIANG Q, YAN C S, LAI J, et al. Large area single-crystal diamond synthesis by 915 MHz microwave plasma-assisted chemical vapor deposition[J]. Crystal Growth & Design, 2014, 14(7): 3234-3238. |
| [12] | SHOJI M, WEI C, AKIRA H, et al. Diamond synthesis by high power microwave plasma (physics, process, instrument & measurement)[J]. Transactions of JWRI, 1988, 17(2): 323-328. |
| [13] | SILVA F, HASSOUNI K, BONNIN X, et al. Microwave engineering of plasma-assisted CVD reactors for diamond deposition[J]. Journal of Physics: Condensed Matter, 2009, 21(36): 364202. |
| [14] | COE S E, SUSSMANN R S. Optical, thermal and mechanical properties of CVD diamond[J]. Diamond and Related Materials, 2000, 9(9/10): 1726-1729. |
| [15] | POPOVICH A F, RALCHENKO V G, BALLA V K, et al. Growth of 4″ diameter polycrystalline diamond wafers with high thermal conductivity by 915 MHz microwave plasma chemical vapor deposition[J]. Plasma Science and Technology, 2017, 19(3): 035503. |
| [16] | AIELLO G, SCHRECK S, AVRAMIDIS K A, et al. Towards large area CVD diamond disks for Brewster-angle windows[J]. Fusion Engineering and Design, 2020, 157: 111818. |
| [17] | LI Y F, AN X M, LIU X C, et al. A 915 MHz/75 kW cylindrical cavity type microwave plasma chemical vapor deposition reactor with a ladder-shaped circumferential antenna developed for growing large area diamond films[J]. Diamond and Related Materials, 2017, 78: 67-72. |
| [18] | 李义锋, 唐伟忠, 姜 龙, 等. 915 MHz高功率MPCVD装置制备大面积高品质金刚石膜[J]. 人工晶体学报, 2019, 48(7): 1262-1267. |
| LI Y F, TANG W Z, JIANG L, et al. Large area high quality diamond films deposition by 915 MHz high power MPCVD reactor[J]. Journal of Synthetic Crystals, 2019, 48(7): 1262-1267 (in Chinese). | |
| [19] | MUEHLE M, ASMUSSEN J, BECKER M F, et al. Extending microwave plasma assisted CVD SCD growth to pressures of 400 Torr[J]. Diamond and Related Materials, 2017, 79: 150-163. |
| [20] | 黄志洵, 王晓金. 微波传输线理论与实用技术[M]. 北京: 科学出版社, 1996. |
| HUANG Z X, WANG X J. Microwave transmission line theory and practical technology[M]. Beijing: Science Press, 1996 (in Chinese). | |
| [21] | 徐锐敏. 微波技术基础[M]. 北京: 科学出版社, 2009. |
| XU R M, TANG P, XUE Z H, et al. Fundamentals of microwave technology[M]. Beijing: Science Press, 2009 (in Chinese). | |
| [22] | 闫润卿, 李英惠. 微波技术基础[M]. 2版. 北京: 北京理工大学出版社, 1997. |
| YAN R Q, LI Y H. Fundamentals of microwave technology[M]. 2nd ed. Beijing: Beijing Institute of Technology Press, 1997 (in Chinese). | |
| [23] | FÜNER M, WILD C, KOIDL P. Simulation and development of optimized microwave plasma reactors for diamond deposition[J]. Surface and Coatings Technology, 1999, 116: 853-862. |
| [24] | PLEULER E, WILD C, FÜNER M, et al. The CAP-reactor, a novel microwave CVD system for diamond deposition[J]. Diamond and Related Materials, 2002, 11(3/4/5/6): 467-471. |
| [25] | SEVILLANO E, WILLIAMS B. Reactor development for microwave plasma deposition of diamond[J]. Diamond Films and Technology, 1998, 8(2): 73-91. |
| [26] | ELLIS H W, PAI R Y, MCDANIEL E W, et al. Transport properties of gaseous ions over a wide energy range[J]. Atomic Data and Nuclear Data Tables, 1976, 17(3): 177-210. |
| [27] | HASSOUNI K, SILVA F, GICQUEL A. Modelling of diamond deposition microwave cavity generated plasmas[J]. Journal of Physics D: Applied Physics, 2010, 43(15): 153001. |
| [28] | TAN W, GROTJOHN T A. Modelling the electromagnetic field and plasma discharge in a microwave plasma diamond deposition reactor[J]. Diamond and Related Materials, 1995, 4(9): 1145-1154. |
| [29] | TAN W, GROTJOHN T A. Modeling the electromagnetic excitation of a microwave cavity plasma reactor[J]. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1994, 12(4): 1216-1220. |
| [30] | GORBACHEV A M, KOLDANOV V A, VIKHAREV A L. Numerical modeling of a microwave plasma CVD reactor[J]. Diamond and Related Materials, 2001, 10(3/4/5/6/7): 342-346. |
| [31] | MANKELEVICH Y A, ASHFOLD M N R, MA J. Plasma-chemical processes in microwave plasma-enhanced chemical vapor deposition reactors operating with C/H/Ar gas mixtures[J]. Journal of Applied Physics, 2008, 104(11): 113304. |
| [32] | YAMADA H, CHAYAHARA A, MOKUNO Y, et al. Model of reactive microwave plasma discharge for growth of single-crystal diamond[J]. Japanese Journal of Applied Physics, 2011, 50(1S1): 01AB02. |
| [33] | HAGELAAR G J M, HASSOUNI K, GICQUEL A. Interaction between the electromagnetic fields and the plasma in a microwave plasma reactor[J]. Journal of Applied Physics, 2004, 96(4): 1819-1828. |
| [34] | GROTJOHN T, LISKE R, HASSOUNI K, et al. Scaling behavior of microwave reactors and discharge size for diamond deposition[J]. Diamond and Related Materials, 2005, 14(3/4/5/6/7): 288-291. |
| [35] | CUENCA J A, MANDAL S, THOMAS E L H, et al. Microwave plasma modelling in clamshell chemical vapour deposition diamond reactors[J]. Diamond and Related Materials, 2022, 124: 108917. |
| [36] | YAMADA H, CHAYAHARA A, MOKUNO Y, et al. Simulation of temperature and gas flow distributions in region close to a diamond substrate with finite thickness[J]. Diamond and Related Materials, 2006, 15(10): 1738-1742. |
| [37] | HASSOUNI K, GROTJOHN T A, GICQUEL A. Self-consistent microwave field and plasma discharge simulations for a moderate pressure hydrogen discharge reactor[J]. Journal of Applied Physics, 1999, 86(1): 134-151. |
| [38] | 邱毓昌, 施围, 张文元. 高电压工程[M]. 西安: 西安交通大学出版社, 1995. |
| QIU Y C, SHI W, ZHANG W Y. High voltage engineering[M]. Xi'an: Xi'an Jiaotong University Press, 1995 (in Chinese). | |
| [39] | 张朝琦, 汪启军, 罗先炽. 新型微波等离子体化学沉积装置的数值仿真[J]. 武汉轻工大学学报, 2024, 43(3): 90-98. |
| ZHANG C, ZHAOQI, WANG Q J, et al. Numerical simulation of a new microwave plasma chemical deposition device[J]. Journal of Wuhan Polytechnic University, 2024, 43(3): 90-98 (in Chinese). | |
| [40] | YAN X S, ZHAO L M, XU W Y, et al. Design of an edge tapered 915 MHz/TM021 microwave plasma reactor by numerical analysis[J]. AIP Advances, 2021, 11(3): 035321. |
| [41] | YANG D, GUO L, WANG B S, et al. Hydrogen plasma characteristics in a microwave chemical vapor deposition chamber[J]. Materials Science and Engineering: B, 2023, 292: 116422. |
| [42] | MALLIK A K, BYSAKH S, DUTTA S, et al. Correlation between optical emission spectra and the process parameters of a 915 MHz microwave plasma CVD reactor used for depositing polycrystalline diamond coatings[J]. Sadhana, 2014, 39(4): 957-970. |
| [43] | MIOTK R, HRYCAK B, JASIŃSKI M, et al. Characterization of an atmospheric-pressure argon plasma generated by 915 MHz microwaves using optical emission spectroscopy[J]. Journal of Spectroscopy, 2017, 2017(1): 6359107. |
| [44] | CHEN C, FU W J, ZHANG C Y, et al. Dual-frequency microwave plasma source based on microwave coaxial transmission line[J]. Applied Sciences, 2021, 11(21): 9873. |
| [45] | FÜNER M, WILD C, KOIDL P. Novel microwave plasma reactor for diamond synthesis[J]. Applied Physics Letters, 1998, 72(10): 1149-1151. |
| [46] | WENG J, XIONG L W, WANG J H, et al. Investigation of depositing large area uniform diamond films in multi-mode MPCVD chamber[J]. Diamond and Related Materials, 2012, 30: 15-19. |
| [47] | LIANG Q, VOHRA Y K, THOMPSON R. High speed continuous and interrupted dry turning of A390 Aluminum/Silicon Alloy using nanostructured diamond coated WC-6 wt.% cobalt tool inserts by MPCVD[J]. Diamond and Related Materials, 2008, 17(12): 2041-2047. |
| [48] | KING D, YARAN M K, SCHUELKE T, et al. Scaling the microwave plasma-assisted chemical vapor diamond deposition process to 150-200 mm substrates[J]. Diamond and Related Materials, 2008, 17(4/5): 520-524. |
| [49] | POPOVICH A F, RALCHENKO V G, BALLA V K, et al. Growth of 4″ diameter polycrystalline diamond wafers with high thermal conductivity by 915 MHz microwave plasma chemical vapor deposition[J]. Plasma Science and Technology, 2017, 19(3): 035503. |
| [50] | SUMANT A V, AUCIELLO O, YUAN H C, et al. Large-area low-temperature ultrananocrystalline diamond (UNCD) films and integration with CMOS devices for monolithically integrated diamond MEMS/NEMS-CMOS systems[J]. Micro- and Nanotechnology Sensors, Systems, and Applications, 2009, 7318: 731817. |
| [51] | BACHMANN P. Plasma chemical vapor deposition of diamond films[M]//The Physics of Diamond. Amsterdam: IOS Press, 1997: 45-71. |
| [52] | ANDO Y, YOKOTA Y, TACHIBANA T, et al. Large area deposition of 〈100〉-textured diamond films by a 60-kW microwave plasma CVD reactor[J]. Diamond and Related Materials, 2002, 11(3/4/5/6): 596-600. |
| [53] | LI Y F, SU J J, LIU Y Q, et al. Design of a new TM021 mode cavity type MPCVD reactor for diamond film deposition[J]. Diamond and Related Materials, 2014, 44: 88-94. |
| [54] | LI X J, TANG W Z, YU S W, et al. Design of novel plasma reactor for diamond film deposition[J]. Diamond and Related Materials, 2011, 20(4): 480-484. |
| [55] | LI Y F, SU J J, LIU Y Q, et al. A circumferential antenna ellipsoidal cavity type MPCVD reactor developed for diamond film deposition[J]. Diamond and Related Materials, 2015, 51: 24-29. |
| [56] | 闫新胜. 20 kW/915 MHz微波等离子体装置的设计与研究[D]. 合肥: 中国科学技术大学, 2021. |
| YAN X S. Design and research of 20 kW/915 MHz microwave plasma device[D]. Beijing: Tsinghua University, 2021 (in Chinese). | |
| [57] | 安 康, 李成明, 陈良贤, 等. 一种M形同轴天线915 MHz微波等离子体化学气相沉积装置: CN113481595A[P]. 2021-10-08. |
| AN K, LI C M, CHEN L X, et al. An M-shaped coaxial antenna 915 MHz microwave plasma chemical vapor deposition device: CN113481595A[P]. 2021-10-08 (in Chinese). | |
| [58] | 安 康, 吴海平, 刘峰斌, 等. 一种高调谐灵敏度的915 MHz微波等离子体化学气相沉积装置: CN116254523B[P]. 2024-02-20. |
| AN K, WU H P, LIU F B, et al . A 915 MHz microwave plasma chemical vapor deposition device with high tuning sensitivity: CN116254523B[P]. 2024-02-20 (in Chinese) | |
| [59] | YANG Z L, AN K, LIU Y C, et al. Edge effect during microwave plasma chemical vapor deposition diamond-film: multiphysics simulation and experimental verification[J]. International Journal of Minerals, Metallurgy and Materials, 2024, 31(10): 2287-2299. |
| [60] | WENG J, WANG J H, DAI S Y, et al. Preparation of diamond films with controllable surface morphology, orientation and quality in an overmoded microwave plasma CVD chamber[J]. Applied Surface Science, 2013, 276: 529-534. |
| [61] | SEDOV V, MARTYANOV A, ALTAKHOV A, et al. Effect of substrate holder design on stress and uniformity of large-area polycrystalline diamond films grown by microwave plasma-assisted CVD[J]. Coatings, 2020, 10(10): 939. |
| [62] | YOKOTA Y, ANDO Y, KOBASHI K, et al. Morphology control of diamond films in the region of α=1-1.5 using a 60-kW microwave plasma CVD reactor[J]. Diamond and Related Materials, 2003, 12(3/4/5/6/7): 295-297. |
| [63] | SCHELZ S, CAMPILLO C, MOISAN M. Characterization of diamond films deposited with a 915-MHz scaled-up surface-wave-sustained plasma[J]. Diamond and Related Materials, 1998, 7(11/12): 1675-1683. |
| [64] | MUCHNIKOV A B, VIKHAREV A L, GORBACHEV A M, et al. Homoepitaxial single crystal diamond growth at different gas pressures and MPACVD reactor configurations[J]. Diamond and Related Materials, 2010, 19(5/6): 432-436. |
| [65] | MALLIK A K, BYSAKH S, PAL K S, et al. Large area deposition of polycrystalline diamond coatings by microwave plasma CVD[J]. Transactions of the Indian Ceramic Society, 2013, 72(4): 225-232. |
| [66] | LOBAEV M A, GORBACHEV A M, BOGDANOV S A, et al. Influence of CVD diamond growth conditions on nitrogen incorporation[J]. Diamond and Related Materials, 2017, 72: 1-6. |
| [67] | YANG B, YU B, LI H N, et al. Enhanced and switchable silicon-vacancy photoluminescence in air-annealed nanocrystalline diamond films[J]. Carbon, 2020, 156: 242-252. |
| [68] | CELII F G, PURDES A J. The effect of flow rate on microwave-assisted diamond CVD[J]. Carbon, 1990, 28(6): 803. |
| [69] | VIKHAREV A L, LOBAEV M A, GORBACHEV A M, et al. Investigation of homoepitaxial growth by microwave plasma CVD providing high growth rate and high quality of diamond simultaneously[J]. Materials Today Communications, 2020, 22: 100816. |
| [70] | RALCHENKO V, SYCHOV I, VLASOV I, et al. Quality of diamond wafers grown by microwave plasma CVD: effects of gas flow rate[J]. Diamond and Related Materials, 1999, 8(2/3/4/5): 189-193. |
| [71] | SU J J, LI Y F, DING M H, et al. A dome-shaped cavity type microwave plasma chemical vapor deposition reactor for diamond films deposition[J]. Vacuum, 2014, 107: 51-55. |
| [72] | SU J, LI Y, LIU Y, et al. Revisiting the gas flow rate effect on diamond films deposition with a new dome-shaped cavity type microwave plasma CVD reactor[J]. Diamond and Related Materials, 2017, 73: 99-104. |
| [73] | WENG J, LIU F, WANG Z T, et al. Investigation on the preparation of large area diamond films with 150-200 mm in diameter using 915 MHz MPCVD system[J]. Vacuum, 2023, 217: 112543. |
| [74] | ZHAI Z F, HUANG N, YANG B, et al. In situ construction of hierarchical diamond supported on carbon nanowalls/diamond for enhanced electron field emission[J]. ACS Applied Materials & Interfaces, 2020, 12(7): 8522-8532. |
| [75] | GAO X W, ZHAO Z W, HE Y, et al. Nanodiamond: a promising metal-free nanoscale material in photocatalysis and electrocatalysis[J]. Rare Metals, 2024, 43(8): 3501-3552. |
| [76] | TU J P, LI J Y, WANG Y, et al. Inch-scale ultrahard diamond wafer with 200 GPa hardness via high-frequency pulsed local non-equilibrium growth[J]. Nature Communications, 2025, 16: 11303. |
| [77] | SCHRECK M, GSELL S, BRESCIA R, et al. Ion bombardment induced buried lateral growth: the key mechanism for the synthesis of single crystal diamond wafers[J]. Scientific Reports, 2017, 7: 44462. |
| [78] | YANG B, LI H N, YU B, et al. Bright silicon vacancy centers in diamond/SiC composite films synthesized by a MPCVD method[J]. Carbon, 2021, 171: 455-463. |
| [79] | GUO X K, YANG B, LU J Q, et al. Electrical tailoring of the photoluminescence of silicon-vacancy centers in diamond/silicon heterojunctions[J]. Journal of Materials Chemistry C, 2022, 10(24): 9334-9343. |
| [80] | LU J Q, YANG B, LI H N, et al. Revealing impurity evolution in silicon-doped diamond film via thermal oxidation[J]. Carbon, 2023, 203: 337-346. |
| [81] | 李廷垟, 刘繁, 翁俊, 等. MPCVD高功率外延生长单晶金刚石均匀性研究[J].表面技术, 2023, 52(5): 278-287. |
| LI T Y, LIU F, WENG J, et al. Homogeneity of single crystal diamond under epitaxial growth by MPCVD high power[J]. Surface Technology, 2023, 52(5): 278-287 (in Chinese). | |
| [82] | 杨国永, 杨明阳, 王 博, 等. 915 MHz高功率MPCVD设备生长8-inch金刚石外延膜[J]. 硬质合金, 2023, 40(2): 98-104. |
| YANG G Y, YANG M Y, WANG B, et al. Eight-inch diamond epitaxial films grown by high-power MPCVD reactor of 915 MHz[J]. Cemented Carbide, 2023, 40(2): 98-104 (in Chinese). | |
| [83] | TZENG Y, TSAI J W, CHIU I L, et al. DC bias enhanced heteroepitaxial nucleation of (100) diamond on Ir(100)/a-sapphire by 915 MHz microwave plasma chemical vapor deposition[J]. Thin Solid Films, 2026, 833: 140839. |
| [1] | LIU Jinhua, YU Jiangang, LI Ziwei, LI Wangwang, YANG Xiaoli, LEI Cheng, LIANG Ting. Simulation Study on Electrical Characteristics of P-NiO/ β -Ga2O3 Heterojunction Lateral Schottky Barrier Diodes [J]. Journal of Synthetic Crystals, 2026, 55(4): 609-618. |
| [2] | CAO Cong, LIU Jianggao, SHE Weilin, FAN Yexia, MA Qisi, LI Zhenxing. Temperature Field Control for the Growth of 150 mm Diameter CZT Crystals [J]. Journal of Synthetic Crystals, 2026, 55(3): 359-367. |
| [3] | ZHAO Qi, LIU Yihao, QI Xiaofang, MA Wencheng, XU Yongkuan, HU Zhanggui. Internal Radiation During β -Ga2O3 Crystal Growth Process by Vertical Bridgman Method [J]. Journal of Synthetic Crystals, 2026, 55(3): 439-451. |
| [4] | WANG Hu, ZHAO Xiaobo, YAN Hao, LU Zhichen, CAO Yancui, ZHANG Shaofeng, SHI Lin, MA Pengfei. Numerical Simulation of Multi-Parameter Control of Gas Flow Patterns During Chemical Vapor Deposition of ZnS [J]. Journal of Synthetic Crystals, 2026, 55(3): 475-485. |
| [5] | ZHANG Hui, QIAN Jun. Analysis of Anisotropic Etching Characteristics and Morphology Simulation of Crystal Silicon [J]. Journal of Synthetic Crystals, 2026, 55(2): 241-252. |
| [6] | MA Wuxiang, GUO Ke, HU Xiaoliang, MEI Haotian, LI Xiaochuan, FAN Jixiang, ZHANG Qian. Numerical Simulation of Influence of Different Shoulder Shapes on Quality of Czochralski Silicon Single Crystals [J]. Journal of Synthetic Crystals, 2026, 55(2): 253-263. |
| [7] | WANG Chuankun, DING Xiya, LIU Bangzhen, HAO Yanling. Performance Optimization of Perovskite Solar Cells Based on the Novel Hole-Transport Layer V2O5 [J]. Journal of Synthetic Crystals, 2026, 55(1): 111-119. |
| [8] | LI Jiancheng, ZHONG Zeqi, WANG Junlei, LI Zaoyang, WEN Yong, WANG Lei, LIU Lijun. Control of Oxygen Content During the Growth of Single Crystal Silicon by Czochralski Method [J]. Journal of Synthetic Crystals, 2025, 54(9): 1525-1533. |
| [9] | LI Xiaochuan, MA Sanbao, ZHOU Fengzi, REN Yongpeng, MA Wuxiang, MEI Haotian. Numerical Simulation for Pipeline Problem of Highly Sb-Doped Czochralski Silicon Single Crystal [J]. Journal of Synthetic Crystals, 2025, 54(9): 1534-1546. |
| [10] | QI Chao, LI Dengnian, LI Zaoyang, YANG Yao, ZHONG Zeqi, LIU Lijun. Power Consumption and Heat Transfer Paths in Czochralski Silicon Crystal Growth under the Influence of Heat Shield [J]. Journal of Synthetic Crystals, 2025, 54(6): 949-959. |
| [11] | LI Xiang, CHEN Gen, SHEN Jie, ZHU Minghui. Effect of Substrate Type on Stress and Crystallinity of Growing Polycrystalline Diamond Film [J]. Journal of Synthetic Crystals, 2025, 54(6): 986-996. |
| [12] | YANG Wenwen, LU Wei, XIE Hui, LIU Gang, LYU Xinyu, BAI Yihan, LI Chenhui, PAN Jiaoqing, ZHAO Youwen, SHEN Guiying. Growth and Performance of Low-Dislocation 6-Inch GaSb Single Crystal [J]. Journal of Synthetic Crystals, 2025, 54(5): 784-792. |
| [13] | ZHU Xingjie, ZHANG Ping, ZUO Dunwen. Effect of Residual Stress and Electric Field on Indentation Hardness of 4H-SiC Surface [J]. Journal of Synthetic Crystals, 2025, 54(4): 560-568. |
| [14] | BAI Shiyu, ZHAO Xingyu, LIN Jiawei, QUAN Guoqiang, WANG Lina. Relationship Between Microstructures of High Concentration Sodium Chloride Aqueous Solutions and Crystals Formed from Them [J]. Journal of Synthetic Crystals, 2025, 54(4): 700-707. |
| [15] | CHEN Danying, YAN Long, LUO Jiahao, ZHENG Zhenyu, JIANG Yong, ZHANG Kai, ZHOU Ning, LIAO Chenzi, GUO Shiping. Effect of C/Si Ratio on SiC Fast Homoepitaxial Growth in Vertical Hot-Wall CVD Reactor [J]. Journal of Synthetic Crystals, 2025, 54(4): 569-580. |
| Viewed | ||||||
|
Full text |
|
|||||
|
Abstract |
|
|||||
E-mail Alert
RSS