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JOURNAL OF SYNTHETIC CRYSTALS ›› 2011, Vol. 40 ›› Issue (3): 700-703.

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Analysis of Structure Defect of In-doped ZnGa2O4 Nanowires

ZHANG Wei-guang;RONG Xian-wei   

  • Online:2011-06-15 Published:2021-01-20

Abstract: In-doped ZnGa2O4 nanowires were synthesized by a thermal evaporation method. Transmission electron microscopy and energy-dispersive X-ray spectroscopy were used to study the structures and components of the product. Twinning and planar dislocations were observed in zigzag and bamboo-like nanowires. The zigzag nanowires are [111] twinning. They grow along the < 111 > direction. Thetwinning angle is 140° . Nanowires with bamboo-like joints grow along the < 011 > direction. Two kinds of planar dislocations are observed in them. The dislocations have an angle about 54° and 90° to the growth direction, respectively. The defects should be important to the properties of the nanostructures.

Key words: In-doped ZnGa2O4 nanowires were synthesized by a thermal evaporation method. Transmission electron microscopy and energy-dispersive X-ray spectroscopy were used to study the structures and components of the product. Twinning and planar dislocations were observed in zigzag and bamboo-like nanowires. The zigzag nanowires are [111] twinning. They grow along the < 111 > direction. Thetwinning angle is 140° . Nanowires with bamboo-like joints grow along the < 011 > direction. Two kinds of planar dislocations are observed in them. The dislocations have an angle about 54° and 90° to the growth direction, respectively. The defects should be important to the properties of the nanostructures.

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