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    20 February 2026, Volume 55 Issue 2
    Reviews
    Application of CdS in Photovoltaic Solar Cells
    ZHANG Chaochao, LI Zechen, TIAN Nan
    2026, 55(2):  163-172.  doi:10.16553/j.cnki.issn1000-985x.2025.0177
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    As a high-performance direct bandgap semiconductor,cadmium sulfide (CdS) is widely used in the photovoltaic field as an electron transport layer,buffer layer,and window layer due to its adjustable bandgap,high carrier mobility,and stable chemical properties. Its excellent light absorption,band alignment,and interfacial properties contribute to improving efficiency and stability of solar cells. This review systematically covers recent CdS applications in perovskite,polymer,and copper indium gallium selenide (CIGS) solar cells,and outlines future trends,offering a clear roadmap for its continued development and practical implementation.

    Research Articles
    Simulation Study of Mid-Infrared Electro-Optic Modulators Based on Thin-Film Lithium Niobate Heterogeneously Integrated with Chalcogenide Glass
    PAN Kaiyan, CAI Heyi, DU Qingyang, QIN Qi, HU Xiaopeng, ZHU Shining
    2026, 55(2):  173-181.  doi:10.16553/j.cnki.issn1000-985x.2025.0206
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    The mid-infrared (MIR) 3~5 μm band spans both an atmospheric transmission window and the molecular fingerprint region,enabling important applications in free-space optical communications,spectroscopic sensing,and thermal imaging. High-speed,low-loss modulators in this band are essential for advancing MIR photonic integrated systems,yet remain challenging to realize. Conventional platforms such as silicon,silicon nitride,aluminum nitride,and gallium arsenide often suffer from carrier absorption,thermo-optic effects,or limited electro-optic (EO) bandwidth in the MIR,making it difficult to simultaneously achieve high modulation efficiency and broad bandwidth. Thin-film lithium niobate (LNOI),featuring a wide transparency window and a strong Pockels effect,is a promising platform for ultrahigh-speed EO modulation;however,commercial LNOI wafers typically incorporate a SiO2 buried-oxide (BOX) layer whose pronounced absorption in the MIR band introduces excess propagation loss,thereby limiting MIR device performance and system-level integration.

    In this work,the BOX-absorption-induced loss bottleneck was addressed by aiming to develop a low-loss,high-efficiency,and ultrabroadband MIR EO modulator compatible with standard commercial LNOI wafers. A heterogeneously integrated LNOI/chalcogenide-glass (ChG) platform was proposed and numerically investigated. The key idea is to employ refractive-index-tunable ChG as an optical guiding layer,with a ChG strip waveguide integrated on the LNOI surface. This design pulls the optical mode upward and markedly reduces modal overlap with the SiO2 BOX layer. This mode-engineering strategy suppresses MIR absorption loss while introducing additional degrees of freedom—via the ChG refractive index and waveguide geometry—for co-optimizing propagation loss,modulation efficiency,and EO bandwidth.

    A Mach-Zehnder modulator was designed on a representative X-cut LNOI/SiO2/Si stack,consisting of a ~900-nm-thick lithium niobate film,a ~4.7-μm-thick SiO2 BOX layer,and a ~500-μm-thick silicon substrate. The device incorporated 1×2 multimode-interference splitters/combiners and a push-pull traveling-wave electrode phase shifter. A multiphysics co-simulation framework was employed for joint optical-RF optimization:on the optical side,the ChG refractive index and key geometric parameters were systematically swept to tailor the modal distribution and minimize propagation loss;on the RF side,electromagnetic simulations were used to optimize electrode dimensions and spacing,enabling optical-microwave group-index matching,reduced microwave attenuation,and favorable impedance matching,thereby enhancing the EO 3 dB bandwidth.

    After comprehensive optimization,the proposed device achieves,at 4.1 μm,a low propagation loss of 0.67 dB/cm,a half-wave voltage-length product of 14.7 V·cm,and an EO 3 dB bandwidth exceeding 110 GHz,demonstrating a compelling combination of low loss,high efficiency,and ultrabroad bandwidth. Overall,these results establish refractive-index-engineered ChG-assisted mode engineering as an effective route to mitigate BOX absorption on commercial LNOI wafers. Compared with alternative approaches relying on deep etching,BOX removal,or substrate re-engineering,this hetero-integration strategy achieves substantial performance improvements with low process invasiveness,offering enhanced platform compatibility and scalability. These findings provide a transferable design paradigm for compact,high-performance MIR EO modulators and may facilitate further advances in high-speed on-chip modulation for MIR communications,sensing,and quantum information processing.

    Precise Measurement of Rising Edge in Fast Luminescent Scintillators and Its Application in Ultrafast Photodetection
    CHEN Zhenhua, LU Yanyu, GUO Zhi, LIU Haigang, ZHANG Xiangzhi, ZOU Ying, WANG Yong, TAI Renzhong, DING Dongzhou, YANG Fan
    2026, 55(2):  182-190.  doi:10.16553/j.cnki.issn1000-985x.2025.0201
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    As a key material for converting high-energy radiation into optical signals,the rise time of scintillators directly affects the time resolution of detection systems. This parameter is crucial for cutting-edge applications such as pulse diagnostics and beam monitoring in X-ray free-electron laser (XFEL) facilities,as well as time-of-flight positron emission tomography (TOF-PET). This work thoroughly explores the significance of the rise time,a core temporal performance parameter of scintillators,highlights the limitations of existing measurement techniques,and proposes an innovative high-precision measurement scheme. The study utilizes a 355 nm picosecond pulsed laser,splitting the beam into trigger and excitation paths,coupled with a spectrometer for monochromatic light selection. This approach effectively overcomes challenges such as laser pulse jitter and weak fluorescence signal acquisition. Experimental results show that,the traditional LYSO∶Ce scintillator has a rise time of (273.7±26.9) ps,while the emerging all-inorganic perovskite scintillator CsPbCl3 exhibits an ultrafast rise time as low as (209.6±6.7) ps and a decay time of only (663.4±34.2) ps. This sub-hundred-picosecond rise time and ultrafast response characteristic highlight the great potential of CsPbCl3 in the field of gigahertz high-repetition-rate ultrafast detectors. It provides critical technical support for bunch-by-bunch diagnostics in synchrotron radiation and free-electron laser facilities,while also offering key methodologies and physical data for the screening and optimization of next-generation ultrafast scintillators.

    Investigation on Effects of Irradiation on the Scintillation Luminescence of Ultrafast Scintillation Crystal YAG∶Yb
    PENG Chen, ZHANG Lu, PAN Mingyan, YAN Xinlong, JIA Yuzhen, WANG Ruichen, DUAN Weiheng, HE Weimin, YANG Weihu, SONG Baijun, CHENG Yao, FAN Xiaoyu, YANG Fan
    2026, 55(2):  191-200.  doi:10.16553/j.cnki.issn1000-985x.2025.0181
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    This study investigated the effects of gamma-ray irradiation from a 137Cs source on the transmittance,photoelectron yield,and cathodoluminescence (CL) emission distribution characteristics of YAG∶Yb crystals with various Yb3+ doping concentrations (1.5%,15% and 50%,atomic fraction),as well as 15%Yb3+ co-doped with 0.05%Na+ and 0.05%Ba2+. The results show that the 15%Yb3+ doped sample exhibits the strongest radiation-induced absorption after gamma-ray irradiation,while its luminescence uniformity remained relatively stable. The normalized CL intensity shows an increase in the root-mean-square deviation to mean ratio (RMS/Mean) from 3.17% (370 nm) and 3.20% (475 nm) to 5.32% and 4.66%,respectively. In contrast,the 1.5%Yb3+ doped sample exhibits weaker radiation-induced absorption but significantly degrade emission uniformity,with the RMS/Mean value for the 370 nm emission increasing from 2.36% to 10.61%. Its photoelectron yield decrease by approximately 22.2%,and the energy resolution deteriorate from 62.0% to 116.6%. These results indicate that under low doping conditions,radiation-induced defects disrupt the spatial uniformity of luminescence,potentially obstructing energy transfer pathways and suppressing charge migration processes,thereby weakening the UV-visible emission. The 50%Yb3+ doped sample exhibits pronounced radiation-induced absorption and luminescence non-uniformity after irradiation. However,its photoelectron yield and energy resolution remained relatively stable,which may be attributed to partial compensation of radiation defect effects by structural distortion induced by the high doping concentration. The Na+/Ba2+ co-doped samples exhibits optimal performance in both radiation-induced absorption suppression and luminescence stability,suggesting that appropriate co-doping can inhibit defect formation and enhance the crystal’s radiation resistance. The comprehensive results demonstrate that the radiation resistance of YAG∶Yb crystals is influenced not only by radiation-induced defect absorption but also closely related to the regulation of luminescence uniformity by crystal defects.

    Growth and Luminescence Properties of Sm2+-Ce3+ Co-Doped CLLB Scintillation Crystals
    WANG Haohan, WEI Qinhua, SHU Chang, YIN Hang, TANG Gao, ZHANG Suyin, QIN Laishun
    2026, 55(2):  201-210.  doi:10.16553/j.cnki.issn1000-985x.2025.0192
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    Due to the better matched with the spectral response of silicon-based photodetectors,offering a promising route toward compact,highly sensitive radiation detection,the near infrared scintillators have attracted much interest. The Sm2+ activated halide scintillators with emission wavelength of 700 nm to 900 nm have been developed. However,the strategy of single Sm2+ doping have some disadvantage of low light out and worse energy resolution. Usually,the co-doping is an effect method to improve the scintillation properties by adjusting the energy transfer efficiency,defect structure and quantity.

    In this work,the Cs2LiLaBr6∶Ce3+ with excellent scintillation properties is chosen as a host,and the Sm2+ is introduced as a near infrared emitting center to construct an energy transfer route from Ce3+ to Sm2+. Cs2LiLaBr6∶Ce3+,Sm2+ single crystals with varied Sm2+ concentrations were successfully grown by the vertical Bridgman method. The axial distribution and segregation behavior of Sm2+ were quantitatively evaluated using ICP-MS,yielding an effective segregation coefficient of about 2.0,which indicates a pronounced tendency of Sm enrichment during crystal growth. Optical properties and energy transfer were investigated by steady state photoluminescence,time resolved decay measurements,and photoluminescence quantum yield. In addition,X-ray excited luminescence and thermoluminescence were employed to probe defect related trapping and radiative processes.

    The co-doped crystals exhibit three characteristic emission bands centered at approximately 390,420 and 770 nm. The two visible bands originate from Ce3+ 5d to 4f transitions,while the near infrared band is assigned to Sm2+ 5d-4f emission,demonstrating successful introduction of near infrared luminescence for the Cs2LiLaBr6 matrix. The spectral overlap between Ce3+ emission and Sm2+ excitation is observed,together with the evolution of decay dynamics,provide strong evidence for energy transfer from Ce3+ to Sm2+. Notably,a number of energies are loss during the energy transfer pathway of Ce-Sm,implying the presence of competing nonradiative channels and trap assisted dissipation. The photoluminescence quantum yield increased firstly and then decreased as Sm2+ concentration raised. It reaches a maximum value of about 98.5% when the Sm2+ concentration is 3%. The concentration quenching is happened for the higher doping concentration. Thermoluminescence and X-ray excited luminescence further reveal that the Sm2+ co-doping reconstructs the defect energy of the host,altering the trap depth and recombination pathways.

    Overall,this study establishes a systematic design and characterization framework for Ce3+ sensitized Sm2+ near infrared emission in the Cs2LiLaBr6 host,provides quantitative insight into dopant segregation,and clarifies the coupled roles of energy transfer losses and defect evolution. These findings offer practical guidance for optimizing near infrared halide scintillators intended for silicon-based readout and advanced radiation detection applications.

    Preparation and Performance of Gadolinium Sulfoxide X-Ray Scintillation Screens Based on Silicon Microchannels
    GUO Dingyi, WANG Guozheng, CHAI Yujia, ZHANG Guangyin, WANG Ji, YANG Jikai, HAO Ziheng, LUO Yang
    2026, 55(2):  211-216.  doi:10.16553/j.cnki.issn1000-985x.2025.0196
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    Gadolinium oxysulfide (GOS) scintillation crystals occupy an irreplaceable position in fields such as non-destructive testing and industrial flaw detection,primarily due to their high responsiveness to high-energy X-rays. Commercially available GOS X-ray scintillation screens typically feature a bulk ceramic structure. However,their resolution is generally low (less than 5 lp/mm) due to the issue of lateral optical crosstalk. In this study,silicon microchannel arrays with periods of 6,10 and 25 μm were fabricated using processes including photolithography,inductively coupled plasma (ICP) etching,and photo-assisted electrochemical etching. Subsequently,GOS X-ray scintillation screens based on these silicon microchannels were successfully prepared via a filling method that combines ultraviolet adhesive and GOS powder. An X-ray testing system was constructed to measure the effect of tube voltage on the brightness of the scintillation screens. The edge spread function (ESF) of the edge images was fitted using MATLAB software to derive the modulation transfer function (MTF),and the spatial resolution of the scintillation screens was further calculated from the MTF. Experimental results indicate that the brightness of the scintillation screens increases with the increase in tube voltage. Specifically,scintillation screens with larger periods exhibit higher brightness,while those with smaller periods demonstrate higher resolution. The resolution values are 18.1,16.8,and 12.0 lp/mm for the screens with periods of 6,10,and 25 μm,respectively.

    Growth of GaN by OVPE Method Based on Ga-Ga2O3 Reaction
    WU Wenxiao, YU Xiangyu, GAN Yunhai, LI Yuewen, ZHENG Youdou, ZHANG Rong, XIU Xiangqian
    2026, 55(2):  217-222.  doi:10.16553/j.cnki.issn1000-985x.2025.0205
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    Large-size and high-quality gallium nitride (GaN) bulk crystals are a fundamental requirement for next-generation power electronics and optoelectronic devices. Hydride vapor phase epitaxy (HVPE) is currently the dominant commercial technology for GaN substrate fabrication. Due to the formation of solid by-products such as NH4Cl,readily block exhaust systems,the long-term growth of GaN have been greatly limited.

    In recent years,oxide vapor phase epitaxy (OVPE) has attracted attention as a promising alternative,since it employs Ga2O vapor as the gallium source and produces only gaseous H2O as a reaction by-product,thereby avoiding solid-phase residues. However,the lack of an efficient,stable,and chemically clean method for generating Ga2O vapor has restrained the development of OVPE. The Ga2O generation routes currently used in OVPE,such as carbon reduction of Ga2O3,hydrogen reduction of Ga2O3,and water vapor oxidation of metallic Ga,have greatly limited the effective supplement of Ga2O as well as the growth rate of GaN.

    Here,based on the high-temperature reaction between metallic Ga and Ga2O3,a novel Ga2O generation strategy with chemically clean is proposed as a Ga2O source for OVPE growth of GaN for the first time. Compared with the conventional approaches,this strategy does not require external reactants and produces no additional by-products. In this work,a thermodynamic analysis was carried out to evaluate the feasibility of the proposed reaction. And the results show that the Gibbs free energy of the Ga-Ga2O3 reaction remains negative in the temperature range of 1 073~1 273 K,indicating that the reaction is thermodynamically spontaneous. The saturated vapor pressure of Ga2O increases exponentially with temperature and approaches nearly 1 000 Pa at 1 273 K,which is suitable for vapor-phase transport. The theoretical growth rate of ~5 400 μm/h for a 2-inch GaN could be achieved at 1 573 K when the Ga2O was complete conversion.

    GaN films were grown on sapphire substrates using a home-made 6-inch vertical OVPE reactor. The Ga source temperature was varied from 900 to 1 070 ℃ while the growth-zone temperature was kept at 1 050 ℃. The results indicate that the GaN growth rate increases exponentially with Ga source temperature,from 0.223 μm/h (950 ℃) to 2.02 μm/h (1 070 ℃),which agrees well with the theoretical calculations. However,the theoretical value is approximately five times the experimental value,leading to an estimated actual conversion efficiency of about 20%. The higher Ga source temperatures also has led to the smoother surface morphology and higher crystalline quality from the observation of XRD and SEM images. Moreover,the growth rate of GaN could be up to ~1 080 μm/h for 2-inch substrate and ~120 μm/h for 6-inch substrate when the Ga source temperatures set as 1 300 ℃ under the standard reaction stoichiometry of 1 mol Ga2O3 to 4 mol Ga. At present,experiments in the high-temperature range of 1 100~1 300 ℃ are in progress,and the specific growth behavior will be reported in future work.

    In summary,a novel Ga2O generation strategy based on the Ga-Ga2O3 high-temperature reaction is proposed and demonstrated for OVPE growth of GaN. Based on the thermodynamic analysis and growth experiments,this work establishes a new technical foundation for high-rate,long-term,and large-size GaN epitaxy.

    Effect of Compositional Disorder on Photoionization Cross Section of Interfacial Hydrogenic Impurity in Ga2O3/(Al x Ga1-x )2O3 Core/Shell Quantum Disk
    YANG Hao, HA Sihua, ZHU Jun
    2026, 55(2):  223-232.  doi:10.16553/j.cnki.issn1000-985x.2025.0213
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    In this paper,a novel core/shell quantum disk structure consisting of the fourth ultrawide band gap semiconductors Ga2O3 as core layer and (Al x Ga1-x2O3 as shell layer were presented. The optical intersubband transitions and corresponding photoionization cross sections between the impurity ground state and unbound state,as well as between different impurity bound states in core/shell quantum disk structure were studied by the finite-difference algorithm combined with the variational approach. The influence from the aluminum compositional disorder was taken into account in the numerical simulation for the first time. The results indicate that the compositional disorder effect has negligible impact on the photoionization cross section corresponding the transition from the impurity ground state to the unbound state. In contrast,the photoionization cross sections of transitions between different impurity-bound states exhibit notable change in resonance peaks due to the random potential fluctuation induced by compositional disorder. These findings can provide theoretical guidelines for further exploration of photonic and optoelectronic devices based on ultrawide bandgap materials.

    Proton Irradiation Effect of β -Ga2O3 Schottky Barrier Diode Based on Monte Carlo Method
    SHI Daotian, SUN Qing, QIAN Yewang, LIU Chuanyang, WU Weifeng, LIU Jingjing, WANG Xinjian, CHEN Zhong, RUAN Zairan, WANG Yangjinghan
    2026, 55(2):  233-240.  doi:10.16553/j.cnki.issn1000-985x.2025.0190
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    In this paper,the SRIM-2013 sofware based on Monte Carlo method was used to simulate the irradiation damage of β-Ga2O3 by protons with energy of 10 ~ 1 000 keV,and by combining with the thermionic emission (TE) model,the effect of proton irradiation on the reverse leakage performance of β-Ga2O3 Schottky barrier diode (SBD) was studied. The simulation results indicate that the stopping power of extranuclear electrons is much greater than stopping power of atomic nucleus. With the proton irradiation dose increases,the displacement per atom (DPA) and Ga vacancy (VGa) concentrations gradually increase,with peak values of 0.007 65 and 3.48 × 1020 cm-3,respectively. With the irradiation energy increases,the irradiation damage gradually penetrates into the interior of β-Ga2O3 target,but the DPA and VGa concentrations gradually decrease. The analysis of the TE model shows that when the carrier concentration decreases from 1×1019 cm-3 to 1×1016 cm-3,the reverse leakage current density decreases,the device reverse leakage performance is significantly improved. The large amount of VGa generated by proton irradiation compensates some carrier,weakening the effect of mirror force on the Schottky barrier,which may be the main reason for the improvement of the reverse leakage performance of β-Ga2O3 SBD devices.

    Analysis of Anisotropic Etching Characteristics and Morphology Simulation of Crystal Silicon
    ZHANG Hui, QIAN Jun
    2026, 55(2):  241-252.  doi:10.16553/j.cnki.issn1000-985x.2025.0211
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    The anisotropic wet etching characteristics of crystal silicon are complex and easily affected by etching conditions and mask shapes,which makes it difficult to accurately predict and control the evolution process and morphology of etching structural. This study was based on experimental data on the all crystal plane etching rate and mask etching structure of crystal silicon,and analyzed in detail the anisotropic etching mechanism and mask etching forming process. A simulation model of crystal silicon etching morphology (Si-LST) was constructed using the Level-Set interpolation method,which achieved accurate interpolation of the all crystal plane etching rate using a small amount of crystal plane etching rate and accurate simulation of etching morphology under any mask. The results show that the Si-LST has high simulation accuracy for concave,convex and composite masks,which can provide efficient process design assistance for the processing and surface quality control of crystal silicon micro-structures.

    Numerical Simulation of Influence of Different Shoulder Shapes on Quality of Czochralski Silicon Single Crystals
    MA Wuxiang, GUO Ke, HU Xiaoliang, MEI Haotian, LI Xiaochuan, FAN Jixiang, ZHANG Qian
    2026, 55(2):  253-263.  doi:10.16553/j.cnki.issn1000-985x.2025.0188
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    The shoulder shape of Czochralski silicon single crystal significantly affects the crystal quality. In this study,CGSim software was used to simulate and analyze the two different shoulder shapes of abrupt shoulder and gradual shoulder during the growth of silicon single crystal. The results show that compared with the abrupt shoulder,the gradual shoulder can form an ideal “M” -shaped convex growth interface,which makes the melt convection more uniform,and the enrichment degree of oxygen content at the solid-liquid interface increases by about 46.75 %. The convex growth interface structure also optimizes the ratio value (V/G) distribution of crystal growth rate (V) to axial temperature gradient (G),which reduces the maximum stress of the gradual shoulder crystal by about 67.72% and increases the stress uniformity by about 62.73%. The above thermodynamic (V/G regulation)-solute transport (oxygen transport behavior)-structural stability (stress suppression) synergistic optimization mechanism clarifies the dynamic coupling relationship between interface shape and stress field and the evolution of defects. The simulation results of different crystal lengths further confirm that the comprehensive optimization mechanism in this mode lays a solid foundation for the subsequent optimization of crystal quality by accurately adjusting the shoulder shape.

    Homoepitaxial Growth of 8-Inch 200 μm 4H-SiC Thick Film for Ultra-High Voltage and High-Current Power Devices
    CAI Zidong, JIANG Yitian, YE Zheng, WU Zihao, FANG Yutao, XIA Yun, CHEN Gang, HU Haolin, WAN Yuxi
    2026, 55(2):  264-273.  doi:10.16553/j.cnki.issn1000-985x.2025.0197
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    The epitaxial growth of 4H-SiC thick films was investigated to meet the requirements for ultra-high-voltage and high-current power devices. Key parameters,including the uniformity of the epitaxial layer's doping concentration and thickness,the suppression of surface defect density,and the enhancement of minority carrier lifetime were explored. The results demonstrate that the uniformity of the epitaxial layer's thickness and doping concentration can be significantly improved through optimized reactor design combined with precise process control. Furthermore,strict control of triangle defects of p-type epi-layer and downfalls during epitaxy is identified as a critical technique for reducing surface defect density and increasing the usable wafer area,which also contributes substantially to the improvement of minority carrier lifetime. High-quality 8 inch 4H-SiC homoepitaxial thick films were successfully fabricated,achieving a thickness of 200 μm with a doping concentration of 1.9×1014 cm-3. The thickness non-uniformity is measured at 0.95%,and the doping concentration non-uniformity is 3.92%. A usable area of 46.5% is obtained for the IGBT structure (based on a 10 mm×10 mm die size),while the diode structure achieve a remarkably high usable area of 96.9%. Minority carrier lifetimes exceeding 5 μs are recorded for both structures. The epitaxial layers were characterized by AFM,which reveal low surface roughness and excellent morphology. This study presents an effective technical approach for producing SiC homoepitaxial thick films with high uniformity,low defect density,and extended minority carrier lifetime. The methodology is demonstrated to be of significant importance for the development of SiC ultra-high-voltage devices (such as IGBT) and their industrial applications in sectors such as novel energy storage systems and smart grids.

    Preparation and Properties of Large-Sized Sapphire Crystal by Edge-Defined Film-Fed Growth Method
    LI Qinglian, SUN Jun, ZHAO Chencheng, LIU Ziqi, XU Jingjun, WANG Xiaoliang, ZHAO Peng, WANG Yubao, HUANG Cunxin
    2026, 55(2):  274-280.  doi:10.16553/j.cnki.issn1000-985x.2025.0182
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    Modern high-tech warfare imposes stringent requirements on armored equipment,demanding the integration of visualization,superior ballistic resistance,lightweight design,and high maneuverability. Sapphire crystals have emerged as a preferred candidate for novel transparent armor systems,attributed to their exceptional optical,mechanical,thermal properties,and robust corrosion resistance. Constrained by limitations in crystal size and manufacturing costs in the early stages,sapphire crystals were predominantly confined to small-scale components such as fairings and face shields. With the advancement of crystal growth technologies,particularly the edge-defined film-fed growth (EFG) method,the fabrication and practical application of large-sized sapphire plates have been successfully realized both domestically and internationally.

    In this study,large-sized sapphire crystals with dimensions of 486 mm×1 000 mm×12 mm were successfully fabricated for the first time using a self-designed large-scale EFG furnace,and their comprehensive performance was systematically characterized. Double-crystal rocking curve measurements via X-ray diffractometer reveals a symmetric peak profile with a full width at half maximum (FWHM) of merely 20.53″,indicating excellent lattice integrity of the as-grown sapphire crystals. Corrosion tests were conducted on samples extracted from different regions of the sapphire crystal using molten KOH;the observation of neat and regular dislocation morphologies enabled the estimation of dislocation density at the magnitude of 103. Surface elemental analysis via energy dispersive spectrometer (EDS) demonstrates the high purity and homogeneous composition of the crystals,with no detectable incorporation of impurity elements such as Mo or C during the growth process. Stress characterization was performed utilizing a large-aperture birefringence stress testing system,with comparative analyses against sapphire crystals prepared by the Kyropoulos method and the conventional single-thermal-field EFG furnace. The results indicate that the stress level of the sapphire crystals prepared in this work is comparable to that of Kyropoulos-grown crystals,and nearly one order of magnitude lower than that of crystals fabricated by the traditional single-thermal-field EFG furnace. Mechanical property tests via a universal electronic testing machine verified that the sapphire plates exhibit outstanding bending strength and elastic modulus,coupled with excellent performance uniformity across the entire sample.

    In conclusion,the large-sized sapphire crystals prepared by the self-designed large-scale EFG furnace demonstrate superior comprehensive performance,rendering them an optimal material for large-sized transparent armor applications. This research not only lays a solid material foundation for the independent research and development,and engineering application of a new generation of high-performance armored equipment,but also holds profound strategic significance and substantial engineering practical value for the advancement of national defense materials technology.

    Crystal Quality of Different Surface Morphologies in Sapphire by EFG Method
    SHU Jun, NIE Lingda, ZHAO Peng, XUE Longfei
    2026, 55(2):  281-290.  doi:10.16553/j.cnki.issn1000-985x.2025.0202
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    In this study,by optimizing the process parameters in the early stage of sapphire growth by the edge-defined film-fed growth (EFG) method,a special interface structure with stepped morphology was successfully induced on the crystal surface. Multiple characterization techniques were employed to systematically compare the crystal quality between the stepped interface and the flat interface. The results show that the full width at half maximum of Raman spectrum,the full width at half maximum of X-ray diffraction(XRD) single crystal rocking curve and the spectral transmittance of the stepped interface samples are better than those of the flat interface samples. In addition,the average bubble sizes of the stepped interface regions are 42.98 μm×37.27 μm and 37.90 μm×35.23 μm,respectively,which are significantly smaller than those in the flat interface (68.04 μm×55.70 μm and 52.03 μm×36.89 μm). The stepped interface also demonstrates lower bubble distribution density,oxygen vacancy concentration and internal stress. Scanning electron microscope observation reveales that the growth steps on the stepped interface are parallel,straight and closely spaced,whereas the growth steps on the flat interface are irregular and loose,with distance of the growth steps on the flat interface is larger than that on the stepped interface. In summary,the stepped interface performs better in crystal structure integrity and optical properties. This study provides a novel process strategy for the controlled growth of high-quality sapphire crystals using the EFG method.

    Machine Learning Accelerated Prediction of Mechanical Properties in SiC Nanophononic Heterostructures
    DU Yifan, LIU Jingsong, JIANG Ping, REN Longjun
    2026, 55(2):  291-300.  doi:10.16553/j.cnki.issn1000-985x.2025.0207
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    To systematically investigate the coupled effects of temperature and pore geometry on the mechanical properties of SiC nanophononic heterostructures (NHs),molecular dynamics simulations combined with a random forest machine learning method are employed to analyze the fracture behavior of SiC NHs under uniaxial tension in the temperature range from 50 K to 500 K. The models feature different pore sizes and aspect ratios of rectangular phononic crystal pores,with interfaces constructed along the armchair and zigzag crystal orientations. The results show that,as temperature increases,the fracture strength and fracture strain of SiC NHs decrease by 20%~32% and 26%~35%,respectively. The pore length of the rectangular phononic pores along the loading direction is identified as the dominant geometric parameter controlling the fracture strength. SiC NHs with armchair interfaces exhibit fracture strengths approximately 15%~20% higher than those with zigzag interfaces,and larger phononic pore sizes significantly intensify local stress concentration and thermal softening effects. The random forest model constructed based on molecular dynamics simulation data achieves high accuracy (R2=0.99) in predicting the fracture properties of SiC NHs,while its computational efficiency is about 600 times higher than that of molecular dynamics tensile simulations. This work provides theoretical support and a fast prediction tool for the controllable fabrication and mechanical performance design of SiC NHs in SiC nano-devices.

    Preparation and Properties of ZnO/CdS∶Zn Heterostructured Photoanodes
    SU Shi, SUN Mingyue, CHE Zhiyuan, ZHANG Lina, WANG Qiushi, MA Jinwen
    2026, 55(2):  301-306.  doi:10.16553/j.cnki.issn1000-985x.2025.0168
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    ZnO nanosheet arrays with highly exposed high-energy facets were successfully prepared on FTO conductive glass using a hydrothermal method. Zn doped CdS nanoparticles were deposited on the surface of ZnO nanosheets via successive ionic layer adsorption and reaction technique,forming a ZnO/CdS∶Zn heterostructure photoanode. The crystal phase,microstructure,optical properties,and photoelectrochemical properties of the prepared photoanodes were systematically characterized and analyzed using X-ray diffraction,scanning electron microscopy,ultraviolet-visible absorption spectroscopy,and a three-electrode photoelectrochemical testing system. The results indicate that Zn doped CdS nanoparticles are uniformly and densely deposited on the surface of ZnO nanosheet arrays. As the number of successive ionic layer adsorption and reaction cycles increases,the light absorption range of the films gradually extends into the visible region,and the photocurrent is significantly enhanced,reaching up to 6.25 mA·cm-2. The study demonstrates that the construction of heterostructures combined with elemental doping synergistically promotes a remarkable improvement in the photoelectrochemical property of the films.

    First-Principles Calculation on Mechanical Properties and p-Type Defects of MgS
    ZOU Jiang, XIE Quan
    2026, 55(2):  307-313.  doi:10.16553/j.cnki.issn1000-985x.2025.0204
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    Transparent conducting materials (TCMs),which combine high optical transparency and good electrical conductivity,are essential in applications such as optoelectronic displays,solar cells,and low-emissivity windows. While n-type TCMs have been widely commercialized,the development of high-performance p-type TCMs remains challenging. MgS,with its wide band gap and high transmittance,has been identified as a promising candidate for p-type TCMs. In this work,the mechanical properties of zinc blende MgS were systematically investigated using hybrid functional method,and its p-type conduction mechanism is further explored through defect calculations. The calculated elastic constants satisfy the Born stability criteria,and the Pugh ratio of 3.08 indicates ductile behavior with a certain degree of anisotropy. Defect calculations reveal that under S-rich conditions,the VMg acts as a shallow acceptor with ionization energy ε(0/-)=0.158 eV,favoring hole conduction. Moreover,a pronounced self-compensation effect is observed between NaMg and Naint under thermodynamic equilibrium,suggesting that non-equilibrium synthesis strategies,such as molecular beam epitaxy,should be considered for achieving stable p-type doping through NaMg defects.

    Synthesis, Crystal Structure and Binding CT-DNA/HSA of [LaL3(H2O)2] n Complex
    HUANG Qiuping, YANG Siming, ZHENG Yanfei, PANG Huayu, HUANG Qiuchan, ZHANG Haiquan
    2026, 55(2):  314-324.  doi:10.16553/j.cnki.issn1000-985x.2025.0198
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    Using the solvothermal method,with 4-methyl-1,2,3-thiadiazole-5-carboxylic acid (HL) as the ligand and reacting with lanthanum nitrate hexahydrate,the thiadiazole lanthanum complex [LaL3(H2O)2n was synthesized. The structure of the complex was characterized by single crystal X-ray diffraction,infrared spectroscopy and elemental analysis. The interaction of the lanthanum complex with calf thymus DNA (CT-DNA) and human serum albumin (HSA) was investigated by ultraviolet (UV) and fluorescence spectroscopy. Single crystal structure tests show that,the complex belongs to the triclinic crystal system,space group P1,unit cell parameters a=0.979 88(5) nm,b=1.057 26(6) nm,c=1.103 62(5) nm,α=105.134(5)°,β=109.816(4)°,γ=94.221(4)°,Z=2,V=1.021 65(10) nm3Dc=1.974 g·cm-3F(000)=598.0,Rint=0.057 3. The lanthanum complex is formed by La3+ coordinating with six 4-methyl-1,2,3-thiadiazole-5-carboxylate anions and two water molecules,resulting in a nine-coordinated distorted three-capped trigonal prism structure. It forms a one-dimensional chain through carboxylate oxygen bridges,and the one-dimensional chains are further assembled into a three-dimensional network through N—H,S—H hydrogen bonds and π…π stacking of the thiadiazole rings.UV and fluorescence spectroscopic analysis indicates that,the complex interacts with CT-DNA and HSA. The quenching constant Ksv of the complex with CT-DNA is 4.75×104 L·mol-1,the quenching rate constant Kq is 4.75×1012 L·mol-1·s-1,the binding rate constant Ka is 2.45×105 L·mol-1,and the binding site n is 1.18. Therefore,it can be concluded that the fluorescence quenching of CT-DNA by the complex is static quenching. The quenching constant Ksv of the complex with HSA is 9.83×104 L·mol-1,the quenching rate constant Kq is 9.83×1012 L·mol-1·s-1,the binding rate constant Ka is 67.61 L·mol-1,and the binding site n is 0.39. The fluorescence quenching of HSA by the complex is static quenching. Hirshfeld analysis shows that there is a strong H…H interaction between molecules.