| [1] |
KE Rui;ZHANG Yu-min;CHEN Zi-yi;ZHOU Yu-feng;SONG Zhi-cheng.
Study on Creep Property of Sapphire Single Crystal during Nanoindentation
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2014, 43(3): 487-491.
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| [2] |
SONG Sheng;CUI Ying-xin;YANG Kun;XU Xian-gang;HU Xiao-bo;HUANG Wan-xia;YUAN Qing-xi.
Quantitative Calculation of the Residual Stress in Crystal Based on Synchrotron Radiation White Beam Topography
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2013, 42(12): 2515-2519.
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| [3] |
HU Ke-yan;TANG Hui-li;WANG Jing-ya;QIAN Xiao-bo;XU Jun;YANG Qiu-hong.
Research on Mechenical Properties and Dislocation Defects of Sapphire Crystal Grown by Edge-Defined Film-Fed Method
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2013, 42(7): 1252-1256.
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| [4] |
JIANG Tao;YAN Cheng-feng;CHEN Jian-jun;LIU Xi;YANG Jian-hua;SHI Er-wei.
Effect of Annealing on the Surface Structure of 6H-SiC Wafer in Ar Atmosphere
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2013, 42(5): 865-868.
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| [5] |
JIANG Jian-jun;DAI Li-dong;LI He-ping;HU Hai-ying;HUI Ke-shi;SHAN Shuang-ming.
Experimental Study on Impedance Spectra of Natural Emei Mountain Basalt under High Temperature and High Pressure
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2013, 42(5): 968-975.
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| [6] |
PENG Yan;NING Li-na;GAO Yu-qiang;XU Hua-yong;SONG Sheng;JIANG Kai;HU Xiao-bo;XU Xian-gang.
Study on Surface Morphology and Polytype Transition of 4H-SiC Single Crystals
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2010, 39(3): 559-563.
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| [7] |
GAO Yu-qiang;PENG Yan;LI Juan;CHEN Xiu-fang;HU Xiao-bo;XU Xian-gang;JIANG Min-hua.
Growth and Defect Characterization of 6H-SiC Single Crystal Seeded (1015) Plane
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2010, 39(2): 287-290.
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| [8] |
WANG Ying-min;NING Li-na;PENG Yan;XU Hua-yong;HU Xiao-bo;XU Xian-gang.
Analysis on Surface Morphology and Defect Generation at the Initial Stages of 6H-SiC Sublimation Growth
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2009, 38(1): 7-10.
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| [9] |
JIANG Shou-zhen;LI Juan;CHEN Xiu-fang;WANG Ying-min;NING Li-na;HU Xiao-bo;XU Xian-gang;WANG Ji-yang;JIANG Min-hua.
Sublimation Growth of 6H-SiC Single Crystal along [1-100] Direction
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2007, 36(1): 14-17.
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| [10] |
PENG Guan-liang;LI Shu-zhi;ZHUANG Yi;ZOU Jun;WANG Yin-zhen;LIU Shi-liang;ZHOU Guo-qing;ZHOU Sheng-ming;XU Jun;GAN Fu-xi.
Effect of Surface Morphology of c-plane Sapphire Substrate on Quality of γ-LiAlO2 Layer Fabricated by Vapor Transport Equilibration Technique
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2005, 34(5): 833-837.
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| [11] |
PENG Guan-liang;ZHOU Guo-qing;Zhuang Yi;ZOU Jun;WANG Yin-zhen;LI Shu-zhi;YANG Wei-qiao;ZHOU Sheng-ming;XU Jun.
Defect Study of r-plane Sapphire Single Crystal Grown by Temperature Gradient Technique
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2005, 34(4): 653-656.
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| [12] |
PENG Guan-liang;Zhuang Yi;ZOU Jun;WANG Yin-zhen;LIU Shi-liang;ZHOU Guo-qing;ZHOU Sheng-ming;XU Jun;GAN Fu-xi.
Study on the Growth of Pure and Ga3+ Doped γ-LiAlO2 Crystals
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2005, 34(3): 399-402.
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| [13] |
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Study on Surface Morphology of Sapphire Crystal Grown by Temperature Gradient Technique(TGT)
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2004, 33(6): 882-886.
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| [14] |
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Defects and Performances of Bi4Ge3O12 Crystal-(1) Defects and Its Formation
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2004, 33(6): 940-944.
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| [15] |
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Observation of Micropipes in 6H-SiC Monocrystalline by Synchrotron Radiation Monochromatic X-ray Topography
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2004, 33(3): 332-334.
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