[1] |
LIU Shuai, XIONG Huifan, YANG Xia, YANG Deren, PI Xiaodong, SONG Lihui.
Effects of Electron Irradiation on Defects of 4H-SiC MOS Materials
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2024, 53(9): 1536-1541.
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[2] |
CHU Xuefeng, HUANG Linmao, ZHANG Qi, XIE Yihan, HU Xiaojun.
Characterization and Analysis of Indium Tin Oxide (ITO) and Fluotin Oxide (FTO) Transparent Conductive Films
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2024, 53(5): 848-854.
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[3] |
LIU Xu-yan;LIU Ci-de;QU Chong-nian;HAI Jing;LU Zhi-wen;HUANG Zhi-xiang.
Numerical Simulation Study on Performance of Nanoscale High k/Si1-xGex NMOSFETs
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2015, 44(12): 3656-3665.
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[4] |
XIE Yinfei, HE Yang, LIU Weiye, XU Wenhui, YOU Tiangui, OU Xin, GUO Huaixin, SUN Huarui.
Recent Progress on Thermal Management of Ultrawide Bandgap Gallium Oxide Power Devices
[J]. JOURNAL OF SYNTHETIC CRYSTALS, 0, (): 1-.
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