Measuring Method of In-situ Photoluminescence Spectra for MOCVD Epitaxy Growth

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JOURNAL OF SYNTHETIC CRYSTALS ›› 2018, Vol. 47 ›› Issue (11): 2316-2321.

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Measuring Method of In-situ Photoluminescence Spectra for MOCVD Epitaxy Growth

YANG Chao-pu;FANG Wen-qing;YANG Lan;LIU Yan-feng;LI Chun;YANG Fan;HAN Xi;ZHANG Mei-li

Online:2018-11-15 Published:2021-01-20

Abstract

CLC Number:

TN305
O43

YANG Chao-pu;FANG Wen-qing;YANG Lan;LIU Yan-feng;LI Chun;YANG Fan;HAN Xi;ZHANG Mei-li. Measuring Method of In-situ Photoluminescence Spectra for MOCVD Epitaxy Growth[J]. Journal of Synthetic Crystals, 2018, 47(11): 2316-2321.

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Measuring Method of In-situ Photoluminescence Spectra for MOCVD Epitaxy Growth

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