Journal of Synthetic Crystals ›› 2025, Vol. 54 ›› Issue (6): 924-934.DOI: 10.16553/j.cnki.issn1000-985x.2024.0272
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YANG Zaihong1,2(
), ZHOU Can2, FAN Liuyan2, ZHANG Yanhui2, CHEN Zezhong1(
), CHEN Pingping2
Received:2024-11-01
Online:2025-06-20
Published:2025-06-23
CLC Number:
YANG Zaihong, ZHOU Can, FAN Liuyan, ZHANG Yanhui, CHEN Zezhong, CHEN Pingping. Research Progress on Application of Machine Learning in Molecular Beam Epitaxy Growth[J]. Journal of Synthetic Crystals, 2025, 54(6): 924-934.
| Algorithmic model | Peculiarity | Reference |
|---|---|---|
| Random forest | It can process a large amount of data and high-dimensional features, is not easy to overfit, and is robust to missing data. But the training time is long, and the interpretability of the model is relatively poor. | [ |
| K-means clustering | Simple, easy to understand and implement, suitable for large-scale datasets. But it is sensitive to the initial clustering center and converges to the local optimal solution. | [ |
| Hierarchical clustering | Ability to organize and present information clearly, making complex concepts and relationships easier to understand and remember. But it can be an oversimplification of complex realities, leading to some information being overlooked or misunderstood. | [ |
| Nonnegative matrix factorization | The latent features in the data can be extracted.But the computational complexity is high, and it is easy to fall into the local optimal solution. | [ |
| Convolutional neural network | It can effectively process two-dimensional data such as images and videos, and has the characteristics of parameter sharing and local connection, which is suitable for extracting spatial features. But the training time is long, the model is poorly interpretable, and it is easy to overfit and other problems. | [ |
| Support vector machine | Able to process high-dimensional data, has good generalization ability, performs well for small-sample data.But has high computational complexity for large-scale datasets, and is sensitive to missing data. | [ |
| Principal components analysis | It can reduce data dimensions, remove noise and redundant information, improve model efficiency, and more. But some information may be lost, sensitivity to outliers, etc. | [ |
Uniform manifold approximation and projection | It has a good ability to express the data of nonlinear structure, and has a fast calculation speed. But the processing capacity for ultra-large-scale data is relatively weak. | [ |
| Logistic regression | It is suitable for binary classification problems, which is fast to computation, easy to explain and implement.But it is not suitable for nonlinear relationships and is susceptible to outliers. | [ |
| Naive bayes | The model is simple, computationally efficient, and performs well with small-scale data. But the conditional independence of the input data is more stringent, and when the assumption is not true, the classification results will be affected. | [ |
Table 1 Common machine learning algorithm models in MBE technology
| Algorithmic model | Peculiarity | Reference |
|---|---|---|
| Random forest | It can process a large amount of data and high-dimensional features, is not easy to overfit, and is robust to missing data. But the training time is long, and the interpretability of the model is relatively poor. | [ |
| K-means clustering | Simple, easy to understand and implement, suitable for large-scale datasets. But it is sensitive to the initial clustering center and converges to the local optimal solution. | [ |
| Hierarchical clustering | Ability to organize and present information clearly, making complex concepts and relationships easier to understand and remember. But it can be an oversimplification of complex realities, leading to some information being overlooked or misunderstood. | [ |
| Nonnegative matrix factorization | The latent features in the data can be extracted.But the computational complexity is high, and it is easy to fall into the local optimal solution. | [ |
| Convolutional neural network | It can effectively process two-dimensional data such as images and videos, and has the characteristics of parameter sharing and local connection, which is suitable for extracting spatial features. But the training time is long, the model is poorly interpretable, and it is easy to overfit and other problems. | [ |
| Support vector machine | Able to process high-dimensional data, has good generalization ability, performs well for small-sample data.But has high computational complexity for large-scale datasets, and is sensitive to missing data. | [ |
| Principal components analysis | It can reduce data dimensions, remove noise and redundant information, improve model efficiency, and more. But some information may be lost, sensitivity to outliers, etc. | [ |
Uniform manifold approximation and projection | It has a good ability to express the data of nonlinear structure, and has a fast calculation speed. But the processing capacity for ultra-large-scale data is relatively weak. | [ |
| Logistic regression | It is suitable for binary classification problems, which is fast to computation, easy to explain and implement.But it is not suitable for nonlinear relationships and is susceptible to outliers. | [ |
| Naive bayes | The model is simple, computationally efficient, and performs well with small-scale data. But the conditional independence of the input data is more stringent, and when the assumption is not true, the classification results will be affected. | [ |
Fig.2 (a) RHEED pattern; (b) AFM image; (c) θ-2θ scanned XRD pattern; (d) cross-sectional HAADF-STEM image of the SrRuO3 thin film with the RRR of 50~52; (e) magnified image near the interface in Fig.(d); (f) magnified image near the interface in Fig.(e)[34]
Fig.8 (a) K-means clustering up to K = 7 for SrTiO3 on TbScO3; (b) mean representative images in each cluster; (c) K-means minimization function plotted for each value of K[45]
Fig.9 NMF with rank 4 for LAO. (a)~(d) corresponding coefficient plots for the four clusters; (e)~(h) corresponding basis plots for the four clusters[47]
Fig.10 PCA results. (a) Six PCs of the RHEED video for the 3UC-thick-ReSe2 thin film, PC1 shows the diffraction signal of graphene, PC2 contains the signals of both the graphene and -ReSe2 layers, PC3-6 show the signal of only the 2D growth of ReSe2 layer; (b) corresponding score plots; (c) original RHEED video; (d)~(e) modified RHEED video. Blue and orange lines denote the (0,0) and (2,0) diffraction streaks of the ReSe2 thin film (shown in the inset), respectively[50]
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