JOURNAL OF SYNTHETIC CRYSTALS ›› 2000, Vol. 29 ›› Issue (2): 180-187.
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JIANG Jian-hua
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CLC Number:
O774
JIANG Jian-hua. Application of Synchrotron Radiation X-ray Topography in the Research of Defects and Crystals Growth[J]. Journal of Synthetic Crystals, 2000, 29(2): 180-187.
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