Effect of Shallow Electron Traps on the Decay Process of Photoelectron in ZnS Crystals

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JOURNAL OF SYNTHETIC CRYSTALS ›› 2005, Vol. 34 ›› Issue (1): 116-119.

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Effect of Shallow Electron Traps on the Decay Process of Photoelectron in ZnS Crystals

DONG Guo-yi;DOU Jun-hong;ZHANG Lei;WEI Zhi-Ren;GE Shi-yan;ZHENG Yi-bo;LIN lin;TIAN Shao-hua

Online:2005-02-15 Published:2021-01-20

Abstract

CLC Number:

O734

DONG Guo-yi;DOU Jun-hong;ZHANG Lei;WEI Zhi-Ren;GE Shi-yan;ZHENG Yi-bo;LIN lin;TIAN Shao-hua. Effect of Shallow Electron Traps on the Decay Process of Photoelectron in ZnS Crystals[J]. Journal of Synthetic Crystals, 2005, 34(1): 116-119.

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Effect of Shallow Electron Traps on the Decay Process of Photoelectron in ZnS Crystals

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