Material Grain Edge Detection Based on Multiscale Wavelet

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JOURNAL OF SYNTHETIC CRYSTALS ›› 2005, Vol. 34 ›› Issue (4): 739-743.

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Material Grain Edge Detection Based on Multiscale Wavelet

ZHAO Xiu-yang;YIN Yan-sheng;YANG Bo

Online:2005-08-15 Published:2021-01-20

Abstract

CLC Number:

TB332

ZHAO Xiu-yang;YIN Yan-sheng;YANG Bo. Material Grain Edge Detection Based on Multiscale Wavelet[J]. Journal of Synthetic Crystals, 2005, 34(4): 739-743.

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Material Grain Edge Detection Based on Multiscale Wavelet

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