Study on Defects in GaN Grown on Silicon

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JOURNAL OF SYNTHETIC CRYSTALS ›› 2005, Vol. 34 ›› Issue (6): 1079-1082.

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Study on Defects in GaN Grown on Silicon

ZHAO Li-wei;LIU Cai-chi;TENG Xiao-yun;ZHU Jun-shan;HAO Qiu-yan;SUN Shi-long;WANG Hai-yun;XU Yue-sheng;HU Jia-hui;FENG Yu-chun;GUO Bao-ping

Online:2005-12-15 Published:2021-01-20

Abstract

CLC Number:

TN304

ZHAO Li-wei;LIU Cai-chi;TENG Xiao-yun;ZHU Jun-shan;HAO Qiu-yan;SUN Shi-long;WANG Hai-yun;XU Yue-sheng;HU Jia-hui;FENG Yu-chun;GUO Bao-ping. Study on Defects in GaN Grown on Silicon[J]. Journal of Synthetic Crystals, 2005, 34(6): 1079-1082.

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Study on Defects in GaN Grown on Silicon

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