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JOURNAL OF SYNTHETIC CRYSTALS ›› 2008, Vol. 37 ›› Issue (1): 147-150.
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LI Lin-na;XUE Jun-ming;ZHAO Ya-zhou;LI Yang-xian;GENG Xin-hua;ZHAO Ying
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RSSOnline:2008-02-15
Published:2021-01-20
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LI Lin-na;XUE Jun-ming;ZHAO Ya-zhou;LI Yang-xian;GENG Xin-hua;ZHAO Ying. Thickness Dependence of In2O3: Sn Film Properties Deposited by Reactive Evaporation[J]. Journal of Synthetic Crystals, 2008, 37(1): 147-150.
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