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JOURNAL OF SYNTHETIC CRYSTALS ›› 2010, Vol. 39 ›› Issue (1): 62-66.

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Effect of Annealing Conditions on the Structural and Physical Properties of Si-based Pb(Zr_(0.4),Ti_(0.6))O_3 Ferroelectric Capacitors with Ti-Al Film As a Barrier Layer

  

  • Online:2010-02-15 Published:2021-01-20

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