Quantitative Calculation of the Residual Stress in Crystal Based on Synchrotron Radiation White Beam Topography

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JOURNAL OF SYNTHETIC CRYSTALS ›› 2013, Vol. 42 ›› Issue (12): 2515-2519.

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Quantitative Calculation of the Residual Stress in Crystal Based on Synchrotron Radiation White Beam Topography

SONG Sheng;CUI Ying-xin;YANG Kun;XU Xian-gang;HU Xiao-bo;HUANG Wan-xia;YUAN Qing-xi

Online:2013-12-15 Published:2021-01-20

Abstract

CLC Number:

O771

SONG Sheng;CUI Ying-xin;YANG Kun;XU Xian-gang;HU Xiao-bo;HUANG Wan-xia;YUAN Qing-xi. Quantitative Calculation of the Residual Stress in Crystal Based on Synchrotron Radiation White Beam Topography[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2013, 42(12): 2515-2519.

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Quantitative Calculation of the Residual Stress in Crystal Based on Synchrotron Radiation White Beam Topography

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