Study on the High Efficiency Mechanism in WEDM of Semiconductor in Micro Contact Condition

JOURNAL OF SYNTHETIC CRYSTALS ›› 2013, Vol. 42 ›› Issue (7): 1336-1342.

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Study on the High Efficiency Mechanism in WEDM of Semiconductor in Micro Contact Condition

PAN Hui-jun;LIU Zhi-dong;QIU Ming-bo;HUANG Sai-juan;TIAN Zong-jun

Online:2013-07-15 Published:2021-01-20

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CLC Number:

TG661

PAN Hui-jun;LIU Zhi-dong;QIU Ming-bo;HUANG Sai-juan;TIAN Zong-jun. Study on the High Efficiency Mechanism in WEDM of Semiconductor in Micro Contact Condition[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2013, 42(7): 1336-1342.

Study on the High Efficiency Mechanism in WEDM of Semiconductor in Micro Contact Condition

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