A Potential Source of Plaque Inspection——Serf Frequency Doubling Microchip Laser NdGdCOB

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JOURNAL OF SYNTHETIC CRYSTALS ›› 2014, Vol. 43 ›› Issue (10): 2757-2760.

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A Potential Source of Plaque Inspection——Serf Frequency Doubling Microchip Laser NdGdCOB

HAN Xue-kun;GUO E-xiang;YU Xiang-sheng;QIU Gang

Online:2014-10-15 Published:2021-01-20

Abstract

CLC Number:

O43

HAN Xue-kun;GUO E-xiang;YU Xiang-sheng;QIU Gang. A Potential Source of Plaque Inspection——Serf Frequency Doubling Microchip Laser NdGdCOB[J]. Journal of Synthetic Crystals, 2014, 43(10): 2757-2760.

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A Potential Source of Plaque Inspection——Serf Frequency Doubling Microchip Laser NdGdCOB

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