Analysis of Microstructure and Photoconductivity Properties of Protocrystalline Silicon Multilayer Thin Films

JOURNAL OF SYNTHETIC CRYSTALS ›› 2014, Vol. 43 ›› Issue (4): 790-795.

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Analysis of Microstructure and Photoconductivity Properties of Protocrystalline Silicon Multilayer Thin Films

YU Wei;ZHAO Si-ming;NIU Ji-wei;YANG Yan-bin;MA Deng-hao;LI Xiao-wei;FU Guang-sheng

Online:2014-04-15 Published:2021-01-20

Abstract

CLC Number:

O613.72

YU Wei;ZHAO Si-ming;NIU Ji-wei;YANG Yan-bin;MA Deng-hao;LI Xiao-wei;FU Guang-sheng. Analysis of Microstructure and Photoconductivity Properties of Protocrystalline Silicon Multilayer Thin Films[J]. Journal of Synthetic Crystals, 2014, 43(4): 790-795.

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Analysis of Microstructure and Photoconductivity Properties of Protocrystalline Silicon Multilayer Thin Films

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