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JOURNAL OF SYNTHETIC CRYSTALS ›› 2017, Vol. 46 ›› Issue (1): 85-93.

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Exploration of WS2-SiO2 Saturable Absorbers Prepared by the Sol-gel Method

LIN Tao;SUN Hang;LI Jing-jing;ZHANG Tian-jie;GUO En-min;SUN Rui-juan;WANG Xi;LI Lu;WANG Yong-gang;DUAN Yu-peng   

  • Online:2017-01-15 Published:2021-01-20

Abstract: Two-dimensional WS2 emerges as a competitive saturable absorber material because of its unique light absorber characteristics. As sol-gel method has the advantages of convenient operation, simple equipment, low cost and so on, so it will be cost-effective fabricating WS2-SiO2 films on the quartz substrate by sol-gel method to produce saturable absorbers. The optimum parameter combination forming the SiO2 film were determined by changing the ratio of raw materials, heat treatment conditions, coating speed and other experimental parameters in the experimental process. Then, WS2 solution was add in the process to prepare WS2-SiO2 saturable absorber based on the successful fabrication of the SiO2 film. After tested by the confocal microscopy, TEM, Raman and XRD methods, the WS2-SiO2 thin film saturable absorbers were found to have smoothing morphology, and WS2 particles in films were found in several layers dimension and polycrystalline structure with obvious crystal face preferred orientation of ( 002 )、(004)、(101)、(103)、(006)、(105).

Key words: Two-dimensional WS2 emerges as a competitive saturable absorber material because of its unique light absorber characteristics. As sol-gel method has the advantages of convenient operation, simple equipment, low cost and so on, so it will be cost-effective fabricating WS2-SiO2 films on the quartz substrate by sol-gel method to produce saturable absorbers. The optimum parameter combination forming the SiO2 film were determined by changing the ratio of raw materials, heat treatment conditions, coating speed and other experimental parameters in the experimental process. Then, WS2 solution was add in the process to prepare WS2-SiO2 saturable absorber based on the successful fabrication of the SiO2 film. After tested by the confocal microscopy, TEM, Raman and XRD methods, the WS2-SiO2 thin film saturable absorbers were found to have smoothing morphology, and WS2 particles in films were found in several layers dimension and polycrystalline structure with obvious crystal face preferred orientation of ( 002 )、(004)、(101)、(103)、(006)、(105).

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