[1] 巩 岩, 张 巍. 193 nm光刻曝光系统的现状及发展[J]. 中国光学与应用光学, 2008, 1(1): 25-35. GONG Y, ZHANG W. Present status and progress in 193 nm exposure system in lithography[J]. Chinese Journal of Applied Optics, 2008, 1(1): 25-35 (in Chinese). [2] 袁琼雁, 王向朝. 国际主流光刻机研发的最新进展[J]. 激光与光电子学进展, 2007, 44(1): 59-61. YUAN Q Y, WANG X Z. Recent development of international mainstream lithographic tools[J]. Laser & Optoelectronics Progress, 2007,44(1): 59-61 (in Chinese). [3] KONSTANTIONS A, WILHELM M. Polarization effects in immersion lithography[J]. SPIE, 2004, 5377: 329-343. [4] 赵 阳. 深紫外光刻复杂照明光学系统设计[D]. 长春:中国科学院长春光学精密机械与物理研究所, 2010: 9-10. ZHAO Y. Design of complex illumination optical system for deep ultraviolet lithography[D]. Changchun: Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2010: 9-10 (in Chinese). [5] 经和贞, 刘承均. 人造石英晶体技术[M]. 北京:科学出版社, 1992: 87-92. JING H Z, LIU C J. Technology of synthetic quartz crystal[M]. Beijing: China Science Publishing & Media Ltd, 1992: 87-92 (in Chinese). [6] 钟乐乐. 超高纯石英纯化制备及机理研究[D]. 武汉: 武汉理工大学, 2015: 65-93. ZHONG L L. Study on purification, preparation and mechanism of ultra-high purity quartz[D]. Wuhan: Wuhan University of Technology, 2015: 65-93 (in Chinese). [7] MULLER A, KRONZ A, BREITER K. Trace elements and growth patterns in quartz: a fingerprint of the evolution of the subvolcanic Podlesi Granite System (Krušne Hory, Czech Republic)[J]. Bulletin of the Czech Geological Survey, 2002, 77(2): 135-145. [8] GOTZE J, PLOTZE M, GRAUPNER T, et al. Trace element incorporation into quartz: a combined study by ICP-MS, electron spin resonance, cathodoluminescence, capillary ion analysis, and gas chromatography[J]. Geochimica et Cosmochimica Acta, 2004, 68(18): 3741-3759. [9] 林 敏, 贾 倩, 刘子源等. 高纯石英(SiO2)评述(二):晶格杂质的活化与分离技术[J]. 矿产综合利用, 2022, 6: 21-25. LIN M, JIA Q, LIU Z Y, et al. Review for high-purity quartz (SiO2) (Part Ⅱ): activation and separation of lattice impurities[J]. Multipurpose Utilization of Mineral Resources, 2022, 6: 21-25 (in Chinese). [10] 尚继武, 刘巨澜, 刘小丰, 等. 人造石英晶体电清洗过程中的直流伏安特性[J]. 人工晶体学报, 2014, 43(3): 565-568. SHANG J W, LIU J L, LIU X F, et al. DC current-voltage characteristics of cultured quartz crystal during the process of sweeping[J]. Journal of Synthetic Crystals, 2014, 43(3): 565-568 (in Chinese). [11] 王强涛. 高品质石英晶体生长及性能表征[D]. 长春:长春理工大学, 2010. WANG Q T. Synthetic and characterization of high-quality quartz crystal[D]. Changchun: Changchun university of science and technology, 2010 (in Chinese). [12] 张绍锋, 张 璇, 刘巨澜, 等. 光学石英晶体条纹缺陷表征[J]. 人工晶体学报, 2012, 41(6): 1578-1580. ZHANG S F, ZHANG X, LIU J L, et al. Analysis of radiated striae in quartz crystal[J]. Journal of Synthetic Crystals, 2012, 41(6): 1578-1580 (in Chinese). [13] 烁光特晶科技有限公司. GBT 7895-2008 人造光学石英晶体[S]. 北京: 中国标准出版社, 2008. Bright Crystals Co., LTD. GBT 7895-2008 Optical grade synthetic quartz crystal[S]. Beijing: Standard press of China, 2008 (in Chinese). [14] 烁光特晶科技有限公司. GBT 7896-2008 人造光学石英晶体试验方法[S]. 北京: 中国标准出版社, 2008. Bright Crystals Co., LTD. GBT 7896-2008 Test method for optical grade synthetic quartz crystal[S]. Beijing: Standard press of China, 2008 (in Chinese). [15] 田丰贵. 光学玻璃内透过率测试新方法[J]. 激光技术, 2003, 27(3): 197-198. TIAN F G. A new method to measure internal transmittance of optical glass[J]. Laser Technology, 2003, 27(3): 197-198 (in Chinese). |