Characterization Method for Internal Defects in Laser Crystals Based on Slice Beam Scanning

Abstract

Abstract: Large size laser crystals are a key component of high-power all solid-state lasers. However, during the crystal growth process, defects such as bubbles and inclusions are inevitably generated, which affect the performance of the laser. In order to quickly and effectively evaluate crystal defects, a three-dimensional imaging system for crystal defects based on sheet beam scanning was established in this paper. In the system, a Powell lens is used to shape a 532 nm point laser to obtain a sheet-like laser. The scattered light generated by crystal defects is obtained through a telecentric lens and CMOS detector to obtain the surface distribution of crystal defects. At the same time, high-precision displacement platforms are used to scan the surface array one by one, completing the three-dimensional distribution scanning of the crystal. Furthermore, combined with digital image processing technology, characterize the surface distribution characteristics of crystal defects and reconstruct the volume distribution characteristics of crystal defects. Based on the above system, intrinsic defects in Yb∶YAG crystals with dimensions of about 50 mm×50 mm×100 mm were measured with a minimum defect detection resolution of 38.69 μm. This article provides a new method for accurately characterizing the internal defects of crystals, and also provides visual data support for high-precision processing of crystal billets in the later stage.

Key words: crystal defect, 3D image, Powell lens, sheet beam, image processing

CLC Number:

QIAN Mengxue, ZHANG Zhirong, WANG Huadong, ZHANG Qingli, SUN Yu. Characterization Method for Internal Defects in Laser Crystals Based on Slice Beam Scanning[J]. JOURNAL OF SYNTHETIC CRYSTALS, 2024, 53(2): 238-245.

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