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人工晶体学报 ›› 2000, Vol. 29 ›› Issue (3): 224-228.

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结晶β-C3N4薄膜的制备和特性研究

陈光华;张阳;朱鹤孙;杨宁   

  1. 北京工业大学,材料科学与工程学院,北京100022;北京理工大学,材料科学研究中心,北京100081
  • 出版日期:2000-03-15 发布日期:2021-01-20
  • 基金资助:
    中国科学院资助项目(69876003);北京市自然科学基金(2982013)

Preparation and Characterization of Crystalline β-C3N4 Films

CHEN Guang-hua;ZHANG Yang;ZHU He-sun;YANG Ning   

  • Online:2000-03-15 Published:2021-01-20

摘要: 用电子回旋共振等离子体化学汽相沉积(ECR CVD)法, 在单晶硅(100)衬底上沉积生长出了具有{221}结构特性的连续的结晶态β-C3N4薄膜.使用扫描电镜(SEM)观测了沉积薄膜的形态;采用X射线光电子光谱(XPS),X射线衍射(XRD)和拉曼散射表征薄膜的结构.研究表明,沉积结晶态β- C3N4薄膜具有{221}结构特性.

关键词: β-C3N4薄膜;化学汽相沉积;电子回旋共振等离子体;薄膜结构

Abstract: A continuous and pure crystalline film of β-C3N4 with {221} textured characteristic has been grown using an ECR CVD (electron cyclotron resonance plasma enhanced chemical vapor deposition) process. The morphology of the deposited films was observed using SEM (scanning electron microscopy). Chemical compositions and chemical states of elements in the deposited films were analyzed using XPS (X-ray photoelectron spectroscopy), XRD (X-ray diffraction) and Raman scattering were used to characterize the film structure.

Key words: A continuous and pure crystalline film of β-C3N4 with {221} textured characteristic has been grown using an ECR CVD (electron cyclotron resonance plasma enhanced chemical vapor deposition) process. The morphology of the deposited films was observed using SEM (scanning electron microscopy). Chemical compositions and chemical states of elements in the deposited films were analyzed using XPS (X-ray photoelectron spectroscopy), XRD (X-ray diffraction) and Raman scattering were used to characterize the film structure.

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