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人工晶体学报 ›› 2007, Vol. 36 ›› Issue (5): 962-966.

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6H-SiC衬底片的表面处理

陈秀芳;徐现刚;胡小波;杨光;宁丽娜;王英民;李娟;姜守振;蒋民华   

  1. 山东大学晶体材料国家重点实验室,济南,250100
  • 出版日期:2007-10-15 发布日期:2021-01-20
  • 基金资助:
    国家自然科学基金(50472068);教育部跨世纪优秀人才培养计划

Surface Treatment of 6H-SiC Substrates

CHEN Xiu-fang;XU Xian-gang;HU Xiao-bo;YANG Guang;NING Li-na;WANG Ying-min;LI Juan;JIANG Shou-zhen;JIANG Min-hua   

  • Online:2007-10-15 Published:2021-01-20

摘要: 相比于蓝宝石,6H-SiC是制作GaN高功率器件更有前途的衬底.本文研究了表面处理如研磨、化学机械抛光对6H-SiC衬底表面特性的影响.用显微镜、原子力显微镜、拉曼光谱、卢瑟福背散射谱表征了衬底表面.结果表明经过两步化学机械抛光后提高了表面质量.经第二步化学机械抛光后的衬底具有优异的表面形貌、高透射率和极小的损伤层,其表面粗糙度RMS是0.12nm.在该衬底上用MOCVD方法长出了高质量的GaN外延膜.

关键词: 6H-SiC;衬底;表面处理;研磨;化学机械抛光

Abstract: 6H-SiC is a more promising substrate than sapphire used for the growth of GaN high power devices. The influence of surface treatments such as lapping, chemi-mechanical polishing on surface properties of 6 H-SiC substrates was studied. Substrate surfaces were investigated by means of optical microscopy, atomic force microscopy, Raman spectroscopy and Rutherford backscattering spectrometry.The results show that the surface quality was improved after two-step chemi-mechanical polishing processes. Substrates after chemimechanical polishing have superior surface morphology, high transmission and least subsurface damage and the surface roughness (RMS) is 0.12nm. High quality GaN epitaxial layers on 6H-SiC substrates were obtained using a metal organic chemical vapor deposition growth technique.

Key words: 6H-SiC is a more promising substrate than sapphire used for the growth of GaN high power devices. The influence of surface treatments such as lapping, chemi-mechanical polishing on surface properties of 6 H-SiC substrates was studied. Substrate surfaces were investigated by means of optical microscopy, atomic force microscopy, Raman spectroscopy and Rutherford backscattering spectrometry.The results show that the surface quality was improved after two-step chemi-mechanical polishing processes. Substrates after chemimechanical polishing have superior surface morphology, high transmission and least subsurface damage and the surface roughness (RMS) is 0.12nm. High quality GaN epitaxial layers on 6H-SiC substrates were obtained using a metal organic chemical vapor deposition growth technique.

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