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人工晶体学报 ›› 2008, Vol. 37 ›› Issue (4): 997-1002.

• • 上一篇    下一篇

B掺杂对平面结构MOCVD-ZnO薄膜性能的影响

陈新亮;XUE Jun-ming;张德坤;SUN Jian;赵颖;GENG Xin-hua   

  1. 光电信息技术科学教育部重点实验室,南开大学,天津大学,天津,300071;南开大学光电子薄膜器件与技术研究所,南开大学光电子薄膜器件与技术天津市重点实验室;Key Laboratory of Opto-electronic Information Science and Technology Nakai University,Tianjin University , Ministry of Education, Tianjin 300071, China
  • 出版日期:2008-08-15 发布日期:2021-01-20
  • 基金资助:
    国家重点基础研究发展计划(973计划)(2006CB202602;2006CB202603);Tianjin Assistant Foundation for the National Basic Research Program of China(07QTPTJC29500);Doctor Start-up Foundation of NankaiUniversity(J02048)

Effect of Boron-doping on Plane Zinc Oxide Thin Films Grown by Metal Organic Chemical Vapor Deposition

CHEN Xin-liang;XUE Jun-ming;ZHANG De-kun;SUN Jian;ZHAO Ying;GENG Xin-hua   

  • Online:2008-08-15 Published:2021-01-20

摘要: 本文研究了B2H6掺杂流量(B掺杂)对平面结构MOCVD-ZnO薄膜的微观结构和光电性能影响.XRD、SEM和AFM测试的研究结果表明,玻璃衬底上制备的ZnO薄膜具有(002)峰择优取向的平面结构,B掺杂使薄膜的球状晶粒尺寸变小,10 sccm流量时晶粒尺寸为~15 nm.ZnO:B薄膜的最小电阻率为5.7×10-3Ω·cm.生长的ZnO薄膜(厚度d=1150 nm)在400~900 nm范围的透过率为82;~97;,且随着B2H6掺杂流量增大,光学吸收边呈现蓝移(即光学带隙Eg展宽)现象.

关键词: MOCVD;ZnO薄膜;B掺杂;太阳电池

Abstract: Transparent conductive boron-doped zinc oxide (ZnO:B) films with plane surface have been deposited on glass substrates by metal organic chemical vapor deposition, using diethylzinc (DEZn) and water as reactant the gases and diborane (B2H6) as the n-type dopant gas. The structural, electrical and optical properties of films grown at 403 K were investigated as a function of B2H6 flow rates (0 ~ 10 sccm). X-ray diffraction spectra (XRD) and scanning electron microscopy (SEM) images indicated these films oriented in the [002] crystallographic direction are with regular and uniformly smooth surfaces and the grain size of the films are smaller ( ~ 15 nm at 10 sccm) that of the undoped sample. Atomic force microscopy (AFM) also revealed that the ZnO:B film (at 10 sccm) was nanostructured and with a surface roughness of ~ 5 nm. The lowest resistivity for the ZnO : B films was about 5.7 × 10-3 Ω · cm. These as-grown ZnO films at different B2H6 flow rates exhibited a high transmittance ( ~ 82; -97; ) in the range of 400-900 nm with a thickness of ~ 1150 nm. The optical absorption edge was shown to shift to higher photon energy with increasing electron concentration, following the Burnstein-Moss law.

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