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人工晶体学报 ›› 2022, Vol. 51 ›› Issue (5): 910-919.

• 研究论文 • 上一篇    下一篇

MPCVD金刚石薄膜微波功率和沉积压力匹配性研究

张帅1, 安康1,2, 邵思武1, 黄亚博1, 杨志亮1, 陈良贤1, 魏俊俊1,2, 刘金龙1,2, 郑宇亭1,2, 李成明1,2   

  1. 1.北京科技大学新材料技术研究院,北京 100083;
    2.北京科技大学顺德研究生院,佛山 528399
  • 收稿日期:2022-02-25 出版日期:2022-05-15 发布日期:2022-06-17
  • 通讯作者: 安 康,博士。E-mail:ank_diamond@163.com; 李成明,博士,教授。E-mail:chengmli@mater.ustb.edu.cn
  • 作者简介:张 帅(1997—),男,陕西省人,硕士研究生。E-mail:18811308896@163.com; 安 康,北京科技大学新材料技术研究院、钢铁冶金新技术国家重点实验室和顺德研究生院博士后。2012年开始从事金刚石装备设计制造、沉积及加工工艺研究。主持和参与国家自然科学基金、国家重点研发计划等项目多项。在Ceramics International、Diamond and Related Materials、Plasma Science and Technology等期刊发表文章多篇,授权发明专利多项。李成明,北京科技大学教授,主要从事CVD金刚石膜与CVD金刚石单晶制备及其功能应用研究。先后主持和参与国家重大专项(子项目)、国家重点研发计划、国际政府间合作项目欧洲地平线计划2020、国家“863”计划、国家“973”计划、国家自然科学基金等项目30多项。发表学术论文300余篇,授权国家发明专利70余项。主持研究的金刚石扩热板应用于北斗卫星系列,获得2019年教育部技术发明一等奖。获得其他省部级奖3项。
  • 基金资助:
    国家磁约束核聚变能发展研究专项资助(2019YFE100200);国家自然科学基金(52102034);中央高校基本科研业务费(FRF-MP-20-48);北京科技大学顺德研究生院博士后研究经费(2020BH015)

Microwave Power and Deposition Pressure Matching of MPCVD Diamond Films

ZHANG Shuai1, AN Kang1,2, SHAO Siwu1, HUANG Yabo1, YANG Zhiliang1, CHEN Liangxian1, WEI Junjun1,2, LIU Jinlong1,2, ZHENG Yuting1,2, LI Chengming1,2   

  1. 1. Institute of Advanced Materials and Technology, University of Science and Technology Beijing, Beijing 100083, China;
    2. Shunde Graduate School, University of Science and Technology Beijing, Foshan 528399, China
  • Received:2022-02-25 Online:2022-05-15 Published:2022-06-17

摘要: 微波等离子体化学气相沉积(MPCVD)法制备的高质量金刚石在很多领域均有广泛应用前景。本研究采用9 kW微波功率,分别在13 kPa、14 kPa、15.5 kPa、17 kPa的腔室压力下进行薄膜沉积实验,发现在15.5 kPa、17 kPa的腔室压力下沉积的薄膜在中心区域出现异常生长情况,具体表现为中心存在明显的阶梯式凸起。为揭示薄膜中心出现异常沉积的原因,使用SEM和Raman分析薄膜表面形貌和质量,通过数值模拟进行沉积过程建模计算和分析功率密度和流场分布。结果表明在相同功率下,提高腔室压力,压缩等离子体,因平均自由程较短,扩散能力不足,将导致衬底中心区域比边缘区域更易密集生长,金刚石薄膜中心区域出现明显的阶梯。同时,薄膜整体的生长速率、均匀性、质量均会在超过压力极值后降低。

关键词: 金刚石薄膜, MPCVD, 沉积压力, 微波功率, 均匀性, 数值模拟

Abstract: High-quality diamond prepared by microwave plasma chemical vapor deposition (MPCVD) has application prospects in many high-precision fields. The film deposition experiments were carried out using microwave power 9 kW. The chamber pressures are 13 kPa, 14 kPa, 15.5 kPa, and 17 kPa, respectively. It was found that the deposited films under pressure of 15.5 kPa and 17 kPa exhibit abnormal growth in the central region, which is manifested as an obvious stepped bulge in the center. Surface morphology and film quality of the film were analyzed by SEM and Raman in order to reveal the reason for the abnormal deposition in the center of the film. Meanwhile, the deposition process was modeled, the power density and flow field distribution were calculated and analyzed by numerical simulation. The results show that at the same power, increasing the chamber pressure and compressing the plasma will lead to more dense growth in the central region of the film than that in the edge region and obvious steps in the central region of the diamond film, due to the short mean free path and insufficient diffusion capacity. The overall growth rate, uniformity and quality of the film will decrease after exceeding pressure limit.

Key words: diamond film, MPCVD, deposition pressure, microwave power, uniformity, numerical simulation

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