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人工晶体学报 ›› 2017, Vol. 46 ›› Issue (1): 13-17.

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降温速率对升级冶金硅定向凝固生长多晶硅少子寿命的影响

刘志辉;罗玉峰;龚洪勇;饶森林;张发云;胡云   

  1. 南昌大学机电工程学院,南昌,330031;南昌大学机电工程学院,南昌330031; 华东交通大学,南昌330013;新余学院新能源科学与工程学院,新余338004; 江西省高等学校硅材料重点实验室,新余338004
  • 出版日期:2017-01-15 发布日期:2021-01-20
  • 基金资助:
    国家自然科学基金(51164033,51664047,51561022,61306084);江西省自然科学基金(20132BAB206021);江西省高等学校科技落地计划(KJLD12050);江西省教育厅科学技术研究项目(GJJ151220、11739、12748、161199、161200)

Influence of Cooling Rate on the Minority Carrier Lifetime of Multicrystalline Silicon Grown with Metallurgical Grade Silicon Feedback by Directional Solidification

LIU Zhi-hui;LUO Yu-feng;GONG Hong-yong;RAO Sen-lin;ZHANG Fa-yun;HU Yun   

  • Online:2017-01-15 Published:2021-01-20

摘要: 对经过前期提纯的冶金级硅料进行一次性定向凝固生长多晶硅铸锭,研究了长晶阶段降温速率对多晶硅少子寿命的影响。结果显示降温速率越低,获得多晶硅少子寿命越高,但降温速率低到一定程度时,少子寿命反而会降低。通过测试生长多晶硅硅锭曲率半径、晶体结构等数据,分析了该现象的产生原因。这将有助于升级冶金硅一次性定向凝固生长多晶硅铸锭的生产应用。

关键词: 多晶硅;冶金硅;定向凝固;降温速率;少子寿命

Abstract: According to multicrystalline silicon ( mc-Si ) ingots cast by one-step directional solidification growth with the pre-purification metallurgical grade silicon feedback, the effect of cooling rate on the minority carrier lifetime of mc-Si ingots can be known. In the study, using a lower cooling rate during growth process of mc-Si ingots, a higher lifetime on the mc-Si ingots can be obtained. But when the cooling rate is low to a certain degree, the minority carrier lifetime of mc-Si ingots reduces. The cause of the phenomenon is analyzed by measuring the curvature radius and the crystal structure of the grown mc-Si ingot. This phenomenon can be used to guide the production applications of metallurgical route with one-step directional solidification growth of mc-Si ingots.

Key words: According to multicrystalline silicon ( mc-Si ) ingots cast by one-step directional solidification growth with the pre-purification metallurgical grade silicon feedback, the effect of cooling rate on the minority carrier lifetime of mc-Si ingots can be known. In the study, using a lower cooling rate during growth process of mc-Si ingots, a higher lifetime on the mc-Si ingots can be obtained. But when the cooling rate is low to a certain degree, the minority carrier lifetime of mc-Si ingots reduces. The cause of the phenomenon is analyzed by measuring the curvature radius and the crystal structure of the grown mc-Si ingot. This phenomenon can be used to guide the production applications of metallurgical route with one-step directional solidification growth of mc-Si ingots.

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