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人工晶体学报 ›› 2023, Vol. 52 ›› Issue (6): 1007-1015.

所属专题: 半导体薄膜与外延技术

• 光电子薄膜 • 上一篇    下一篇

切割角蓝宝石基氧化镓薄膜MOCVD外延及日盲紫外光电探测器制备

汪正鹏, 张崇德, 孙新雨, 胡天澄, 崔梅, 张贻俊, 巩贺贺, 任芳芳, 顾书林, 张荣, 叶建东   

  1. 南京大学电子科学与工程学院,南京 210023
  • 收稿日期:2023-03-20 出版日期:2023-06-15 发布日期:2023-06-30
  • 通信作者: 叶建东,博士,教授。E-mail:yejd@nju.edu.cn
  • 作者简介:汪正鹏(1997—),男,安徽省人,博士研究生。E-mail:zpwang@smail.nju.edu.cn
  • 基金资助:
    国家重点研发计划(2022YFB3605403);国家自然科学基金(62234007,62293521,U21A20503,U21A2071);广东省重点研发计划(2020B010174002)

MOCVD Epitaxy of β-Ga2O3 Films on Off-Cut Angled Sapphire Substrates and Fabrication of Solar-Blind Ultraviolet Photodetector

WANG Zhengpeng, ZHANG Chongde, SUN Xinyu, HU Tiancheng, CUI Mei, ZHANG Yijun, GONG Hehe, REN Fangfang, GU Shulin, ZHANG Rong, YE Jiandong   

  1. School of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China
  • Received:2023-03-20 Online:2023-06-15 Published:2023-06-30

摘要: 本文使用金属有机物化学气相沉积(MOCVD)法在不同切割角的c面蓝宝石衬底上外延氧化镓(β-Ga2O3)单晶薄膜,揭示了衬底切割角对外延薄膜晶体质量的影响规律。研究表明,当衬底切割角为6°时,β-Ga2O3外延膜具有较小的X射线摇摆曲线半峰全宽(1.10°)和最小的表面粗糙度(7.7 nm)。在此基础上,采用光刻、显影、电子束蒸发及剥离工艺制备了金属-半导体-金属结构的日盲紫外光电探测器,器件的光暗电流比为6.2×106,248 nm处的峰值响应度为87.12 A/W,比探测率为3.5×1015 Jones,带外抑制比为2.36×104,响应时间为226.2 μs。

关键词: 超宽禁带半导体, 氧化镓薄膜, 金属有机物化学气相沉积, 日盲紫外光电探测器, 切割角, 外延

Abstract: In this work, single-crystal gallium oxide (β-Ga2O3) thin films were epitaxially grown on different off-cut angled c-plane sapphire substrates by metal organic chemical vapor deposition (MOCVD), and the effect of off-cut angles on the crystal quality and surface roughness of the epitaxial films were investigated. For the β-Ga2O3 epilayer grown on the 6° off-cut angled sapphire substrate, the full width at half maximum (FWHM) of the rocking curve is reduced to be 1.10°, together with the smallest surface roughness of 7.7 nm. Consequently, the metal-semiconductor-metal structured solar-blind ultraviolet photodetectors were fabricated by lithography, development, electron beam evaporation and lift-off techniques. The photodetector has excellent performances, including photo-dark current ratio of 6.2×106, peak photoresponsivity of 87.12 A/W at 248 nm, specific detectivity of 3.5×1015 Jones, UV-visible rejection ratio of 2.36×104, and total response time of 226.2 μs.

Key words: ultra-wide bandgap semiconductor, β-Ga2O3 film, metal organic chemical vapor deposition, solar-blind ultraviolet photodetector, off-cut angle, epitaxy

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