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JOURNAL OF SYNTHETIC CRYSTALS ›› 2023, Vol. 52 ›› Issue (6): 1007-1015.

Special Issue: 半导体薄膜与外延技术

• Optoelectronic Thin Films • Previous Articles     Next Articles

MOCVD Epitaxy of β-Ga2O3 Films on Off-Cut Angled Sapphire Substrates and Fabrication of Solar-Blind Ultraviolet Photodetector

WANG Zhengpeng, ZHANG Chongde, SUN Xinyu, HU Tiancheng, CUI Mei, ZHANG Yijun, GONG Hehe, REN Fangfang, GU Shulin, ZHANG Rong, YE Jiandong   

  1. School of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China
  • Received:2023-03-20 Online:2023-06-15 Published:2023-06-30

Abstract: In this work, single-crystal gallium oxide (β-Ga2O3) thin films were epitaxially grown on different off-cut angled c-plane sapphire substrates by metal organic chemical vapor deposition (MOCVD), and the effect of off-cut angles on the crystal quality and surface roughness of the epitaxial films were investigated. For the β-Ga2O3 epilayer grown on the 6° off-cut angled sapphire substrate, the full width at half maximum (FWHM) of the rocking curve is reduced to be 1.10°, together with the smallest surface roughness of 7.7 nm. Consequently, the metal-semiconductor-metal structured solar-blind ultraviolet photodetectors were fabricated by lithography, development, electron beam evaporation and lift-off techniques. The photodetector has excellent performances, including photo-dark current ratio of 6.2×106, peak photoresponsivity of 87.12 A/W at 248 nm, specific detectivity of 3.5×1015 Jones, UV-visible rejection ratio of 2.36×104, and total response time of 226.2 μs.

Key words: ultra-wide bandgap semiconductor, β-Ga2O3 film, metal organic chemical vapor deposition, solar-blind ultraviolet photodetector, off-cut angle, epitaxy

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