Abstract: TeO2 crystals were grown by Bridgman method. Optical microscopy, electronic diffraction spectrum, and chemical etching were used to investigate the crystal defects. The formation mechanism of different defects such as scatter-point, cleavage, bubble and black inclusion, striation and etch pit was discussed. The results indicated that scatter-points were resulted from impurities of starting materials. Cleavages are mainly caused by crystal stress. Formations of black inclusions and bubbles were mainly related to the growth temperatures. Furthermore, some suggestions to decrease the defects were put forward.

Key words: TeO2 crystals were grown by Bridgman method. Optical microscopy, electronic diffraction spectrum, and chemical etching were used to investigate the crystal defects. The formation mechanism of different defects such as scatter-point, cleavage, bubble and black inclusion, striation and etch pit was discussed. The results indicated that scatter-points were resulted from impurities of starting materials. Cleavages are mainly caused by crystal stress. Formations of black inclusions and bubbles were mainly related to the growth temperatures. Furthermore, some suggestions to decrease the defects were put forward.