关键词: 微波吸收介电谱;掺杂浓度;光电子衰减;浅电子陷阱

Abstract: The decay spectra of the free and shallow-trapped photoelectrons at the first exposure time in cubic AgCl microcrystals doped with [Fe(CN)_6]~(4-) were obtained by microwave absorption and dielectric spetrum mesurement technique. It is found that the free photoelectrons decay time increased from 116ns to 1133 ns as the doping concentration increasing. By analyzing the photoelectrons decay curve, it is also found that the doping concentration increasing, the first slower decay section becomes faster and the second faster decay section slower, as a whole the decay time increased. The variation of the doping concentration has greater impact on the photoelectrons later decay part. The result shows that the doping introduces shallow electron traps which can delay the decay process of the photoelectrons, and with the doping concentration increasing, the characteristic of shallow electron traps becomes remarkable.