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JOURNAL OF SYNTHETIC CRYSTALS ›› 2011, Vol. 40 ›› Issue (2): 359-364.

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Experimental Investigation on the Detection Technique for Surface Layer Damage of Machined Silicon Wafers

ZHANG Yin-xia;LI Da-lei;GAO Wei;KANG Ren-ke   

  • Online:2011-04-15 Published:2021-01-20

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