快发光闪烁体上升沿精确测量及其在超快光电探测中的应用

doi:10.16553/j.cnki.issn1000-985x.2025.0201

人工晶体学报 ›› 2026, Vol. 55 ›› Issue (2): 182-190.DOI: 10.16553/j.cnki.issn1000-985x.2025.0201

快发光闪烁体上升沿精确测量及其在超快光电探测中的应用

陈振华¹(), 陆彦宇¹^,²^,³, 郭智¹^,³(), 刘海岗¹^,³, 张祥志¹^,³, 邹鹰¹(), 王勇¹^,³, 邰仁忠¹^,³, 丁栋舟⁴, 杨帆⁵

^1.中国科学院上海高等研究院，上海同步辐射光源，上海 201210
^2.中国科学院上海应用物理研究所，上海 201800
^3.中国科学院大学，北京 101408
^4.中国科学院上海硅酸盐研究所，上海 201899
^5.南开大学物理科学学院，天津 300071

收稿日期:2025-09-14 出版日期:2026-02-20 发布日期:2026-03-06
通信作者: 郭智，博士，研究员。E-mail:guoz@sari.ac.cn；邹鹰，博士，正高级工程师。E-mail:zouy@sari.ac.cn
作者简介:陈振华（1982—），男，河南省人，高级工程师。E-mail:chenzhenhua@sari.ac.cn
基金资助:
国家重点研发计划(2022YFB3503900)

Precise Measurement of Rising Edge in Fast Luminescent Scintillators and Its Application in Ultrafast Photodetection

CHEN Zhenhua¹(), LU Yanyu¹^,²^,³, GUO Zhi¹^,³(), LIU Haigang¹^,³, ZHANG Xiangzhi¹^,³, ZOU Ying¹(), WANG Yong¹^,³, TAI Renzhong¹^,³, DING Dongzhou⁴, YANG Fan⁵

^1.Shanghai Synchrotron Radiation Facility，Shanghai Advanced Research Institute，Chinese Academy of Sciences，Shanghai 201210，China
^2.Shanghai Institute of Applied Physics，Chinese Academy of Sciences，Shanghai 201800，China
^3.University of Chinese Academy of Sciences，Beijing 101408，China
^4.Shanghai Institute of Ceramics，Chinese Academy of Sciences，Shanghai 201899，China
^5.School of Physics，Nankai University，Tianjin 300071，China

Received:2025-09-14 Online:2026-02-20 Published:2026-03-06

摘要/Abstract

摘要： 闪烁体作为将高能辐射转化为光信号的关键材料，其上升沿时间直接影响探测系统的时间分辨率，对于X射线自由电子激光（XFEL）设施中的脉冲诊断与束流监测，以及飞行时间正电子发射断层扫描（TOF-PET）等前沿领域至关重要。本工作旨在深入探讨闪烁体上升沿这一核心时间性能参数的重要性及其现有测量技术的瓶颈，并提出一种创新的高精度测量方案。研究利用355 nm皮秒脉冲激光，通过分光将光束分为触发光路与激发光路，并耦合光谱仪进行单色光选择，有效克服了激光脉冲抖动和弱荧光信号采集难题。实验测得，相比LYSO∶Ce闪烁体的上升时间为（273.7±26.9） ps，新兴的CsPbCl₃全无机钙钛矿闪烁体展现出低至（209.6±6.7） ps的超快上升时间，而衰减时间仅为（663.4±34.2） ps。这一百皮秒级的上升时间与超快响应特性，揭示了CsPbCl₃在吉赫兹高重频超快探测器领域的巨大潜力，为同步辐射和自由电子激光装置诊断提供了关键技术支撑，也为下一代超快闪烁体的筛选优化提供了关键方法与物理数据。

关键词: 钙钛矿闪烁体; CsPbCl₃; 上升时间; 高重频; X射线探测器; 吉赫兹

Abstract: As a key material for converting high-energy radiation into optical signals，the rise time of scintillators directly affects the time resolution of detection systems. This parameter is crucial for cutting-edge applications such as pulse diagnostics and beam monitoring in X-ray free-electron laser （XFEL） facilities，as well as time-of-flight positron emission tomography （TOF-PET）. This work thoroughly explores the significance of the rise time，a core temporal performance parameter of scintillators，highlights the limitations of existing measurement techniques，and proposes an innovative high-precision measurement scheme. The study utilizes a 355 nm picosecond pulsed laser，splitting the beam into trigger and excitation paths，coupled with a spectrometer for monochromatic light selection. This approach effectively overcomes challenges such as laser pulse jitter and weak fluorescence signal acquisition. Experimental results show that，the traditional LYSO∶Ce scintillator has a rise time of （273.7±26.9） ps，while the emerging all-inorganic perovskite scintillator CsPbCl₃ exhibits an ultrafast rise time as low as （209.6±6.7） ps and a decay time of only （663.4±34.2） ps. This sub-hundred-picosecond rise time and ultrafast response characteristic highlight the great potential of CsPbCl₃ in the field of gigahertz high-repetition-rate ultrafast detectors. It provides critical technical support for bunch-by-bunch diagnostics in synchrotron radiation and free-electron laser facilities，while also offering key methodologies and physical data for the screening and optimization of next-generation ultrafast scintillators.

Key words: perovskite scintillator; CsPbCl₃; rise time; high-repetition-rate; X-ray detector; gigahertz

中图分类号:

O799

陈振华, 陆彦宇, 郭智, 刘海岗, 张祥志, 邹鹰, 王勇, 邰仁忠, 丁栋舟, 杨帆. 快发光闪烁体上升沿精确测量及其在超快光电探测中的应用[J]. 人工晶体学报, 2026, 55(2): 182-190.

CHEN Zhenhua, LU Yanyu, GUO Zhi, LIU Haigang, ZHANG Xiangzhi, ZOU Ying, WANG Yong, TAI Renzhong, DING Dongzhou, YANG Fan. Precise Measurement of Rising Edge in Fast Luminescent Scintillators and Its Application in Ultrafast Photodetection[J]. Journal of Synthetic Crystals, 2026, 55(2): 182-190.

图/表 6

图1 CsPbCl3缺陷态能级结构及载流子弛豫路径示意图

Fig.1 Schematic diagram of defect energy level structure and carrier relaxation pathways in CsPbCl3

图2 高精度TCSPC上升沿测量系统示意图及测试结果。（a） TCSPC系统原理及光路设计（M1-M2为反射镜，Beam splitter为分束器，Fast photodiode为触发光电二极管）；（b）实验系统在420 nm处测得IRF；（c）高斯拟合IRF的FWHM为0.15 ns。测试采用355 nm激光器进行测量，测试强度为50 mW

Fig.2 Schematic diagram and test results of a high-precision TCSPC rising edge measurement system. （a） Principle and optical path design of TCSPC system （M1-M2 are mirrors，Beam splitter is a beam splitter，Fast photodiode is a trigger photodiode）；（b） IRF measured by experimental system at 420 nm；（c） FWHM of Gaussian-fitted IRF is 0.15 ns. The test was conducted using a 355 nm laser with an intensity of 50 mW

图3 CsPbCl3单晶形貌及光学性质表征。（a）CsPbCl3单晶的SEM照片，右上角插图CsPbCl3单晶实物的光学照片；（b）通过温度梯度法优化缺陷密度，劳厄衍射图确认纯钙钛矿相；（c）CsPbCl3单晶在355 nm激光器下激发的光致发光（PL）光谱，测试扫描步长为1 nm

Fig.3 Characterization of morphology and optical properties of CsPbCl3 single crystals. （a） SEM image of a CsPbCl3 single crystal，with an optical photograph of actual crystal shown in inset in upper right corner；（b） defect density optimized by temperature gradient method，with Laue diffraction pattern confirming a pure perovskite phase；（c） photoluminescence （PL） spectrum of CsPbCl3 single crystal excited by a 355 nm laser，with a scanning step size of 1 nm

图4 LYSO及CsPbCl3单晶的TCSPC测试结果。（a）LYSO∶Ce在420 nm处的TCSPC测量结果，激发光为355 nm；（b）CsPbCl3单晶在420 nm处的TCSPC测量结果，所有测量均在同一样品上，不同位置进行了6次测量

Fig.4 TCSPC test results of LYSO and CsPbCl3 single crystals. （a） TCSPC measurement results of LYSO∶Ce at 420 nm，with excitation light at 355 nm；（b） TCSPC measurement results of CsPbCl3 single crystals at 420 nm，all measurements were performed at six different positions on the same sample

表1 上升时间和衰减时间测量数值

Table 1 Rise time and decay time measured values

Measurement times	Rise time/ns		Decay time/ns
Measurement times	CsPbCl₃	LYSO	CsPbCl₃	LYSO
1	0.207 8	0.245 2	0.606 1	41.903 8
2	0.213 4	0.307 6	0.722 7	43.340 8
3	0.214 7	0.283 5	0.654 0	43.815 0
4	0.213 1	0.255 3	0.660 7	40.100 0
5	0.195 4	0.306 4	0.662 0	36.890 0
6	0.213 0	0.244 3	0.674 7	44.745 0
Average value	0.209 6	0.273 7	0.663 4	41.799 1
Standard deviation	0.006 7	0.026 9	0.034 2	2.649 4
Deviation/%	3.20	9.81	5.16	6.34

图5 自由电子激光丢束诊断装置及测试结果。（a）丢束诊断装置图；（b）闪烁体在丢束诊断对自由电子激光单脉冲的响应，所用XFEL的能量为600 eV，重复频率为10 Hz；（c）皮秒脉冲激光器激发CsPbCl3单晶的示波器图像，脉冲间隔0.95 ns

Fig.5 Free-electron laser beam loss diagnostic setup and test results. （a） Diagram of free-electron laser beam loss diagnostic device；（b） response of scintillator to single pulses from the free-electron laser in beam loss diagnostics，with an XFEL energy of 600 eV and a repetition rate of 10 Hz；（c） oscilloscope image of a CsPbCl3 single crystal excited by a picosecond pulsed laser，with a pulse interval of 0.95 ns

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快发光闪烁体上升沿精确测量及其在超快光电探测中的应用

Precise Measurement of Rising Edge in Fast Luminescent Scintillators and Its Application in Ultrafast Photodetection

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