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人工晶体学报 ›› 2026, Vol. 55 ›› Issue (8): 1252-1260.DOI: 10.16553/j.cnki.issn1000-985x.2026.0064

• 研究论文 • 上一篇    下一篇

CaF2晶体亚表面损伤层表征及其光热弱吸收关联特性研究

闫柯1,2(), 梅炳初1, 张博2, 寇华敏2, 姜大朋2, 高文兰3, 苏良碧2()   

  1. 1.武汉理工大学材料复合新技术全国重点实验室,武汉 430070
    2.中国科学院上海硅酸盐研究所功能晶体与器件全国重点实验室,上海 200050
    3.中国科学院上海硅酸盐研究所关键陶瓷材料全国重点实验室,上海 200050
  • 收稿日期:2026-04-16 出版日期:2026-08-20 发布日期:2026-08-26
  • 通信作者: 苏良碧,博士,研究员。E-mail:suliangbi@mail.sic.ac.cn
  • 作者简介:闫柯(2001—),男,湖北省人,硕士研究生。E-mail:3108698321@qq.com
  • 基金资助:
    国家自然科学基金(52450255);国家自然科学基金(W2412088);中国科学院稳定支持基础研究领域青年团队项目(YSBR-024)

Characterization of Subsurface Damage Layer in CaF2 Crystals and Its Correlation Properties of Photothermal Weak Absorption

YAN Ke1,2(), MEI Bingchu1, ZHANG Bo2, KOU Huamin2, JIANG Dapeng2, GAO Wenlan3, SU Liangbi2()   

  1. 1.State Key Laboratory of New Technologies for Composite Materials,Wuhan University of Technology,Wuhan 430070,China
    2.State Key Laboratory of Functional Crystals and Devices,Shanghai Institute of Ceramics,Chinese Academy of Sciences,Shanghai 200050,China
    3.State Key Laboratory of Key Ceramic Materials,Shanghai Institute of Ceramics,Chinese Academy of Sciences,Shanghai 200050,China
  • Received:2026-04-16 Online:2026-08-20 Published:2026-08-26

摘要: 光学元件的表面质量直接决定其光学性能与使用寿命,其中亚表面损伤(SSD)层作为影响光学元件功能和可靠性的核心因素,已成为光学元件应用中的重点关注指标。本文以CaF2晶体为研究对象,围绕亚表面损伤层的表征及与355 nm波段光热弱吸收的关联展开研究。通过对晶体样品的亚表面损伤层厚度进行系统表征,并测试其在355 nm波段的光热弱吸收率,系统分析了亚表面损伤层厚度与光热弱吸收率之间的关系。结果表明,355 nm波段光热弱吸收率与SSD层厚度呈正相关,当损伤层厚度从51.57 nm增至154.09 nm时,光热弱吸收最大值由2.58×10-6提高至45.16×10-6,弱吸收平均值由0.43×10-6提高至7.85×10-6。本研究明确了亚表面损伤层对CaF2晶体光热弱吸收的影响规律,可为优化晶体加工工艺、抑制弱吸收损耗、提升晶体激光损伤阈值提供实验依据与理论支撑。

关键词: CaF2晶体; 亚表面损伤层; 光热弱吸收; 化学腐蚀法; 表面粗糙度

Abstract: The surface quality of optical components directly determines their optical performance and service life. Among these factors, the subsurface damage (SSD) layer is a key factor affecting the functionality and reliability of optical components and has become a focal point in their application. This paper takes CaF2 crystals as the research subject and focuses on the characterization of the subsurface damage layer and its correlation with photothermal weak absorption in the 355 nm wavelength band. By systematically characterizing the thickness of the subsurface damage layer in crystal samples and measuring their photothermal weak absorption rates at 355 nm, the relationship between subsurface damage layer thickness and photothermal weak absorption rate was systematically analyzed. The results indicate that the photothermal weak absorption rate in the 355 nm band is positively correlated with SSD thickness. As the damage layer thickness increase from 51.57 nm to 154.09 nm, the maximum photothermal weak absorption rise from 2.58×10-6 to 45.16×10-6, and the average weak absorption increase from 0.43×10-6 to 7.85×10-6. This study has elucidated the mechanism by which subsurface damage layers affect the photothermal weak absorption of CaF2 crystals, providing both experimental evidence and theoretical support for optimizing crystal processing techniques, mitigating losses due to weak absorption, and enhancing the crystals’ laser damage thresholds.

Key words: CaF2 crystal; subsurface damage layer; photothermal weak absorption; chemical etching method; surface roughness

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