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JOURNAL OF SYNTHETIC CRYSTALS ›› 2012, Vol. 41 ›› Issue (3): 594-598.

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Growth and Characterization of Si-doped GaAs Crystals for LED Application

JIN Min;XU Jia-yue;FANG Yong-zheng;HE Qing-bo;ZHOU Ding;SHEN Hui   

  • Online:2012-06-15 Published:2021-01-20

Abstract: Si-doped <511>orientation GaAs crystal was grown by Bridgman method.PBN crucible with a seed well was used and quartz ampoule was adopted to protect the evaporation of As in the process of growth.The doping technology,solid-liquid interface morphology and growth defects were investigated.The twinning was a crucial problem for the pulling-down growth of Si-doped < 511> GaAs crystal.The formation mechanism of the twins was suggested and the growth parameters were optimized.2-inch Sidoped GaAs crystal has been grown successfully and X-ray rocking curve showed that FWHM was about 40 arcsec.

Key words: Si-doped <511>orientation GaAs crystal was grown by Bridgman method.PBN crucible with a seed well was used and quartz ampoule was adopted to protect the evaporation of As in the process of growth.The doping technology,solid-liquid interface morphology and growth defects were investigated.The twinning was a crucial problem for the pulling-down growth of Si-doped < 511> GaAs crystal.The formation mechanism of the twins was suggested and the growth parameters were optimized.2-inch Sidoped GaAs crystal has been grown successfully and X-ray rocking curve showed that FWHM was about 40 arcsec.

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