Journal of Synthetic Crystals ›› 2025, Vol. 54 ›› Issue (12): 2083-2100.DOI: 10.16553/j.cnki.issn1000-985x.2025.0109
• Research Articles • Previous Articles Next Articles
XU Binjie1,2(
), CHEN Pengyang1,2(
), LU Sheng’ou1,2, XUAN Lingling1,2, WANG Anqi1,2, WANG Fan1,2, PI Xiaodong1,2(
), YANG Deren1,2, HAN Xuefeng1,2(
)
Received:2025-05-22
Online:2025-12-20
Published:2026-01-04
CLC Number:
XU Binjie, CHEN Pengyang, LU Sheng’ou, XUAN Lingling, WANG Anqi, WANG Fan, PI Xiaodong, YANG Deren, HAN Xuefeng. Effects of the Temperature Gradient on the Fracture Stress of Large-Sized SiC Grown by PVT Method[J]. Journal of Synthetic Crystals, 2025, 54(12): 2083-2100.
Fig.1 (a) Schematic of the core section for the 3D global model of the crucible; (b) mesh structure for the 3D thermal stress calculation; (c) schematic diagram of the transformation from 2D temperature distribution to 3D temperature distribution
Fig.2 Left half: physical model of SiC PVT growth; right half: meshing of the computational model, with the enlarged view showing the dynamic mesh boundary conditions conditions, here, Pi(s)* and Pi(p)* represent the saturated equilibrium pressures of each gas-phase component at the seed crystal and powder source surfaces, respectively, where i denotes the gas-phase components Si, Si2C, and SiC2
Fig.3 (a) Hexagonal unit cell of SiC with schematic diagram of basal (blue) and prismatic (yellow) plane slips, where a represents the unit vectors of the slip direction of BPDs, b and c represent the unit normal vectors of the prismatic plane and basal planes, respectively; (b) basal plane of the hexagonal crystal system of SiC
| Vector | On-axis | 4° off-axis |
|---|---|---|
Table 1 Unit vectors of the slip direction and the unit normal vectors of the slip plane for different slip systems under on-axis and 4° off-axis growth conditions in the Cartesian coordinate system
| Vector | On-axis | 4° off-axis |
|---|---|---|
| Slip system | |||
|---|---|---|---|
| Basal plane | |||
| Prismatic plane | |||
Table 2 Slip systems of basal and prismatic plane slips in the Cartesian coordinate system under on-axis growth
| Slip system | |||
|---|---|---|---|
| Basal plane | |||
| Prismatic plane | |||
| Basal plane | |||
|---|---|---|---|
| Prismatic plane | |||
Table 3 Linear relationship between RSS and the stress tensors in the Cartesian coordinate system for basal plane and prismatic plane slips under on-axis growth
| Basal plane | |||
|---|---|---|---|
| Prismatic plane | |||
| Basal plane | |||
|---|---|---|---|
| Prismatic plane | |||
Table 4 Linear relationship between the plastic strain tensors in the Cartesian coordinate system and the plastic strains in each slip system for basal and prismatic plane slips under on-axis growth
| Basal plane | |||
|---|---|---|---|
| Prismatic plane | |||
Fig.4 Schematic diagrams of a 4H-SiC crystal and wafer under off-axis grown. (a) Side view of the SiC crystal; (b) top view of the SiC wafer; (c) side view of the SiC wafer; (d) crystal coordinate system coordinate system (colored) with an off-angle and the Cartesian coordinate system (dashed line); (e) cylindrical coordinate with an off-angle
| Slip System | |||
|---|---|---|---|
| Basal plane | |||
| Prismatic plane | |||
Table 5 Slip systems of basal and prismatic plane slips in the Cartesian coordinate system under 4° off-axis growth
| Slip System | |||
|---|---|---|---|
| Basal plane | |||
| Prismatic plane | |||
| Basal plane | ||||||
|---|---|---|---|---|---|---|
| Prismatic plane | ||||||
Table 6 Linear relationship between RSS and the stress tensors in the Cartesian coordinate system for basal plane and prismatic plane slips under 4° off-axis growth
| Basal plane | ||||||
|---|---|---|---|---|---|---|
| Prismatic plane | ||||||
| Basal plane | |||
|---|---|---|---|
| Prismatic plane | |||
Table 7 Linear relationship between the plastic strain tensors in the Cartesian coordinate system and the plastic strains in each slip system for basal and prismatic plane slips under 4° off-axis growth
| Basal plane | |||
|---|---|---|---|
| Prismatic plane | |||
Fig.5 Temperature profile and distribution of the elastic component of σφφ (σφφe) of SiC crystal under on-axis and 4° off-axis growth for cooling time of 0 and 480 min
Fig.6 (a)~(c) Half-sectional 3D view of the RSS distributions in the basal plane slip systems α1, α2, and α3 under on-axis growth, with section planes taken as [11ˉ00], [01ˉ10], [101ˉ0] crystallographic planes, respectively. The non-displayed half-sections are symmetrically distributed with respect to the displayed half-sections along their respective section planes; (d)~(f) 3D view of the RSS distributions in the basal plane slip systems α1, α2, and α3, respectively, under 4° off-axis growth; (g)~(i) 3D view of the RSS distributions in the prismatic plane slip systems α1, α2, and α3, respectively, under on-axis growth, exhibiting perfect 120° rotational symmetry among the 3 systems; (j)~(l) 3D view of the RSS distributions in the prismatic plane slip systems α1, α2, and α3, respectively, under 4° off-axis growth, maintaining approximate 120° rotational symmetry among the 3 systems
Fig.7 (a)~(c) Half-sectional 3D view of the plastic strain distributions caused by the basal plane slip systems α1, α2, and α3 under on-axis growth, with section planes taken as [11ˉ00], [01ˉ10], [101ˉ0] crystallographic planes, respectively, the non-displayed half-sections are symmetrically distributed with respect to the displayed half-sections along their respective section planes; (d)~(f) 3D view of the plastic strain distributions caused by the basal plane slip systems α1, α2, and α3, respectively, under 4° off-axis growth; (g)~(i) 3D view of the plastic strain distributions caused by the prismatic plane slip systems α1, α2, and α3, respectively, under on-axis growth, exhibiting perfect 120° rotational symmetry among the 3 systems; (j)~(l) 3D view of the plastic strain distributions caused by the prismatic plane slip systems α1, α2, and α3, respectively, under 4° off-axis growth, maintaining approximate 120° rotational symmetry among the 3 systems
Fig.8 3D view of the σφφ distribution after 480 min of cooling, accounting for the plastic strains due to basal plane slips (a), (b), and prismatic plane slips (c), (d). Where (a) and (c) are calculated under on-axis growth, and (b) and (d) are calculated under 4° off-axis growth
Fig.10 (a) Schematic diagram illustrating the variation in convexity and the radial temperature distribution; (b) radial temperature distribution curves on the seed surface for different convexities; (c) radial temperature distribution curves normalized by subtracting the values at the 100 mm radius (T100) for easier visual comparison; (d) evolution of the maximum RSS in the prismatic plane slip systems with cooling time for different convexities; (e) evolution of σφφe at the periphery of the seed surface with cooling time for different convexities, the inset shows the point where the σφφe value is extracted; (f) maximum RSS during high temperature growth for different convexities, calculated by considering axial strain (3D) and neglecting axial strain (2D-plane), along with the ratio of the two; (g)~(i) distributions of 12σrr-σφφ, which represent the radial cross-section of the maximum RSS value at high temperature, for convexities of 0, 8, and 16 mm, respectively
Fig.11 (a) Schematic diagram illustrating the variation in diameter and the radial temperature distribution, with the crystal convexity maintained to be 0; (b) radial temperature distribution curves on the seed surface for different diameters; (c) maximum RSS during high temperature growth for different diameters, calculated by considering axial strain (3D) and neglecting axial strain (2D-plane), along with the ratio of the two
Fig.12 (a) Evolution of the maximum RSS in the prismatic plane slip systems with cooling time for different diameters; (b) evolution of σφφe at the periphery of the seed surface with cooling time for different diameters, the inset shows an enlargement of the data points after 400 min of cooling
Fig.13 Evolution of the crystal interface, crystal meshing, and 12σrr-σφφ, which represent the radial cross-section of the maximum RSS in the prismatic plane slip systems, during crystal growth
Fig.14 (a) Radial temperature distribution curves on the seed surface for different growth time; (b) evolution of the maximum RSS during growth time, calculated by considering axial strain (3D) and neglecting axial strain (2D-plane), along with the ratio of the two; (c) evolution of σφφe at the periphery of the seed surface during growth time
| [1] | BALIGA B J. Power semiconductor device figure of merit for high-frequency applications[J]. IEEE Electron Device Letters, 1989, 10(10): 455-457. |
| [2] | SHE X, HUANG A Q, LUCÍA Ó, et al. Review of silicon carbide power devices and their applications[J]. IEEE Transactions on Industrial Electronics, 2017, 64(10): 8193-8205. |
| [3] | KIMOTO T. Bulk and epitaxial growth of silicon carbide[J]. Progress in Crystal Growth and Characterization of Materials, 2016, 62(2): 329-351. |
| [4] | WRIGHT N G, HORSFALL A B, VASSILEVSKI K. Prospects for SiC electronics and sensors[J]. Materials Today, 2008, 11(1/2): 16-21. |
| [5] | HUANG Y C, WANG R, QIAN Y X, et al. Theoretical study on the improvement of the doping efficiency of Al in 4H-SiC by co-doping group-IVB elements[J]. Chinese Physics B, 2022, 31(4): 046104. |
| [6] | TONG Z Y, BU M X, ZHANG Y Q, et al. Hyperdoped silicon: processing, properties, and devices[J]. Journal of Semiconductors, 2022, 43(9): 093101. |
| [7] | GENG W H, YANG G, ZHANG X Q, et al. Identification of subsurface damage of 4H-SiC wafers by combining photo-chemical etching and molten-alkali etching[J]. Journal of Semiconductors, 2022, 43(10): 102801. |
| [8] | YANG G, LUO H, LI J J, et al. Discrimination of dislocations in 4H-SiC by inclination angles of molten-alkali etched pits[J]. Journal of Semiconductors, 2022, 43(12): 122801. |
| [9] | YEO I G, YANG W S, PARK J H, et al. Two-inch a-plane (11-20) 6H-SiC crystal grown by using the PVT method from a small rectangular substrate[J]. Journal of the Korean Physical Society, 2011, 58(5(2)): 1541-1543. |
| [10] | AGARWAL A, DAS M, KRISHNASWAMI S, et al. SiC power devices-an overview[J]. MRS Online Proceedings Library, 2004, 815: 243. |
| [11] | LIU G Y, WU Y B, LI K J, et al. Development of high power SiC devices for rail traction power systems[J]. Journal of Crystal Growth, 2019, 507: 442-452. |
| [12] | HAN L B, LIANG L, KANG Y, et al. A review of SiC IGBT: models, fabrications, characteristics, and applications[J]. IEEE Transactions on Power Electronics, 2021, 36(2): 2080-2093. |
| [13] | CHANG K P, LIN P J, HORNG R H, et al. Growth characteristics of Fe-doped GaN epilayers on SiC (001) substrates and their effects on high breakdown voltage devices[J]. Materials Science in Semiconductor Processing, 2020, 119: 105228. |
| [14] | MUSOLINO M, XU X P, WANG H, et al. Paving the way toward the world’s first 200 mm SiC pilot line[J]. Materials Science in Semiconductor Processing, 2021, 135: 106088. |
| [15] | CHEN X F, YANG X L, XIE X J, et al. Research progress of large size SiC single crystal materials and devices[J]. Light, Science & Applications, 2023, 12(1): 28. |
| [16] | XIONG X X, YANG X L, CHEN X F, et al. Fabrication of 8-inch N-type 4H-SiC single crystal substrate with low dislocation density[J]. Journal of Inorganic Materials, 2023, 38(11): 1371. |
| [17] | HU G J, ZHONG G L, XIONG X X, et al. Improvement of the resistivity uniformity of 8-inch 4H-SiC wafers by optimizing the thermal field[J]. Vacuum, 2024, 222: 112961. |
| [18] | YANG X L, PAN Y N, GAO C, et al. Development of high quality 8 inch 4H-SiC substrates[J]. Solid State Phenomena, 2023, 344: 41-46. |
| [19] | XU B J, LU S O, CUI H, et al. The fracture stress of 8-inch silicon carbide during the PVT growth[J]. CrystEngComm, 2024, 26(39): 5550-5560. |
| [20] | GUO J Q, YANG Y, GOUE O Y, et al. Study on the role of thermal stress on prismatic slip of dislocations in 4H-SiC crystals grown by PVT method[J]. ECS Transactions, 2016, 75(12): 163-168. |
| [21] | GUO J Q, YANG Y, RAGHOTHAMACHAR B, et al. Prismatic slip in PVT-grown 4H-SiC crystals[J]. Journal of Electronic Materials, 2017, 46(4): 2040-2044. |
| [22] | LU S O, XU B J, WANG Y Z, et al. Distribution of basal plane dislocations in 4-degree off-axis 4H-SiC single crystals[J]. CrystEngComm, 2024, 26(16): 2143-2154. |
| [23] | XU B J, HAN X F, XU S C, et al. Optimization of the thermal field of 8-inch SiC crystal growth by PVT method with “3 separation heater method”[J]. Journal of Crystal Growth, 2023, 614: 127238. |
| [24] | LU S, XU B J, CHEN H Y, et al. Study of effects of varying parameters on the dislocation density in 200 mm SiC bulk growth[J]. Journal of Crystal Growth, 2024, 627: 127526. |
| [25] | LILOV S K. Study of the equilibrium processes in the gas phase during silicon carbide sublimation[J]. Materials Science and Engineering: B, 1993, 21(1): 65-69. |
| [26] | CHEN Q S, ZHANG H, PRASAD V, et al. Kinetics and modeling of sublimation growth of silicon carbide bulk crystal[J]. Journal of Crystal Growth, 2001, 224(1/2): 101-110. |
| [27] | CHEN Q S, ZHANG H, MA R H, et al. Modeling of transport processes and kinetics of silicon carbide bulk growth[J]. Journal of Crystal Growth, 2001, 225(2/3/4): 299-306. |
| [28] | XU B J, HAN X F, XU S C, et al. Numerical simulation of the transport of gas species in the PVT growth of single-crystal SiC[J]. Crystal Research and Technology, 2024, 59(7): 2300354. |
| [29] | SEGAL A S, VOROB’EV A N, KARPOV S Y, et al. Transport phenomena in sublimation growth of SiC bulk crystals[J]. Materials Science and Engineering: B, 1999, 61: 40-43. |
| [30] | MA R H, CHEN Q S, ZHANG H, et al. Modeling of silicon carbide crystal growth by physical vapor transport method[J]. Journal of Crystal Growth, 2000, 211(1/2/3/4): 352-359. |
| [31] | CHEN Q S, ZHANG H, PRASAD V. Heat transfer and kinetics of bulk growth of silicon carbide[J]. Journal of Crystal Growth, 2001, 230(1/2): 239-246. |
| [32] | PRASAD V, PENDURTI S. Hand book of crystal growth[M]// PRASAD V, PENDURTI S. Models for stress and dislocation generation in melt based compound crystal growth. Berlin, Heidelberg: Springer, 2010: 1335-1378. |
| [33] | ZHANG Z B, LU J, CHEN Q S, et al. Thermoelastic stresses in SiC single crystals grown by the physical vapor transport method[J]. Acta Mechanica Sinica, 2006, 22(1): 40-45. |
| [34] | GAO B, KAKIMOTO K. Three-dimensional modeling of basal plane dislocations in 4H-SiC single crystals grown by the physical vapor transport method[J]. Crystal Growth & Design, 2014, 14(3): 1272-1278. |
| [35] | ASARO R J. Crystal plasticity[J]. Journal of Applied Mechanics, 1983, 50(4b): 921-934. |
| [36] | MIYAZAKI N, SAKAGUCHI M. Three-dimensional dislocation density analysis of bulk semiconductor single crystal during CZ growth process[J]. Transactions of the Japan Society of Mechanical Engineers Series A, 2002, 68(665): 21-25. |
| [37] | MATSUNAMI H, KIMOTO T. Step-controlled epitaxial growth of SiC: high quality homoepitaxy[J]. Materials Science and Engineering: R: Reports, 1997, 20(3): 125-166. |
| [38] | LIU C J, CHEN X L, PENG T H, et al. Step flow and polytype transformation in growth of 4H-SiC crystals[J]. Journal of Crystal Growth, 2014, 394: 126-131. |
| [39] | HU S S, FANG S, LIU Y F, et al. Characterization of prismatic slip in SiC crystals by chemical etching method[J]. Materials Science Forum, 2023, 1089: 45-50. |
| [40] | LU S O, XU B J, XUAN L L, et al. Comparing basal and prismatic slips induced by thermal stresses in 4H-SiC crystals[J]. CrystEngComm, 2024, 26(44): 6244-6254. |
| [41] | LARA A, MUÑOZ A, CASTILLO-RODRÍGUEZ M, et al. Plastic behaviour of 4H-SiC single crystals deformed at temperatures between 800 and 1300 ℃[J]. Ceramics International, 2012, 38(2): 1381-1390. |
| [42] | HU S S, FANG H Y, LIU Y F, et al. Characterization of prismatic slip in PVT-grown AlN crystals[J]. Journal of Crystal Growth, 2022, 584: 126548. |
| [43] | GACHKEVICH A R, BOICHUK V Y. Thermal stress of a long cylinder heated by thermal radiation[J]. Soviet Applied Mechanics, 1987, 23(4): 328-332. |
| [44] | XU B J, CUI H, CHEN P Y, et al. Effects of the thermal field on the diameter enlargement of 200 mm SiC by PVT method[J]. CrystEngComm, 2025, 27(9): 1315-1324. |
| [45] | XU B J, UNIVERSITY Z, et al. Formation mechanisms of polytype-induced parallel slits in off-axis 4H-SiC crystals[J]. Crystal Growth & Design, 2025, 25(13): 5067-5074. |
| [46] | LU S O, XU B J, XUAN L L, et al. Numerical analysis on the thermal stress and dislocation density of a 300 mm SiC single crystal grown by the PVT method[J/OL]. CrystEngComm, 2025. (2025-07-31)[2025-09-01] . |
| [47] | 刘春俊. SiC单晶生长及缺陷研究[D]. 北京: 中国科学院大学, 2013. |
| LIU C J. Study on the growth and defects of SiC single crystals[D]. Beijing: University of Chinese Academy of Sciences, 2013 (in Chinese). | |
| [48] | 王波. SiC单晶生长、缺陷和导电性质研究[D]. 北京:中国科学院大学, 2014. |
| WANG B. Research on the growth, defects and electrical properties of SiC single crystals[D]. Beijing: University of Chinese Academy of Sciences, 2014 (in Chinese). |
| [1] | LI Xiaochuan, MA Sanbao, ZHOU Fengzi, REN Yongpeng, MA Wuxiang, MEI Haotian. Numerical Simulation for Pipeline Problem of Highly Sb-Doped Czochralski Silicon Single Crystal [J]. Journal of Synthetic Crystals, 2025, 54(9): 1534-1546. |
| [2] | LU Runlin, ZHENG Lili, ZHANG Hui, WANG Rensong, HU Dongli. Impacts of Hot Wall CVD Process Conditions on Thickness Uniformity of 8-Inch SiC Epitaxial Layer [J]. Journal of Synthetic Crystals, 2025, 54(9): 1509-1524. |
| [3] | LI Jiancheng, ZHONG Zeqi, WANG Junlei, LI Zaoyang, WEN Yong, WANG Lei, LIU Lijun. Control of Oxygen Content During the Growth of Single Crystal Silicon by Czochralski Method [J]. Journal of Synthetic Crystals, 2025, 54(9): 1525-1533. |
| [4] | LI Shifeng, YANG Jinfeng, HUANG Yunqi, ZHANG Bo, LIU Ziqi, SUN Jun, PAN Shilie. Inclusion Defects in Ca(BO2)2 Crystals Grown by Czochralski Method [J]. Journal of Synthetic Crystals, 2025, 54(9): 1501-1508. |
| [5] | ZHANG Shuyi, LIU Gengling, WANG Hao, LU Yue, JIANG Xianyuan, LI Wenzhuo, LIU Cong, LYU Yingbo, WU Zhongchen, LIU Dong, CHEN Yao. Research Progress of Tin-Based Perovskite Crystals and Devices [J]. Journal of Synthetic Crystals, 2025, 54(7): 1189-1207. |
| [6] | QI Chao, LI Dengnian, LI Zaoyang, YANG Yao, ZHONG Zeqi, LIU Lijun. Power Consumption and Heat Transfer Paths in Czochralski Silicon Crystal Growth under the Influence of Heat Shield [J]. Journal of Synthetic Crystals, 2025, 54(6): 949-959. |
| [7] | YANG Wenwen, LU Wei, XIE Hui, LIU Gang, LYU Xinyu, BAI Yihan, LI Chenhui, PAN Jiaoqing, ZHAO Youwen, SHEN Guiying. Growth and Performance of Low-Dislocation 6-Inch GaSb Single Crystal [J]. Journal of Synthetic Crystals, 2025, 54(5): 784-792. |
| [8] | DU Qingbo, YANG Yapeng, GAO Xudong, ZHANG Zhi, ZHAO Xiaoyu, WANG Huiqi, LIU Yier, LI Guoqiang. Research Progress of Wide Band Gap Semiconductor Silicon Carbide Based Nuclear Radiation Detector [J]. Journal of Synthetic Crystals, 2025, 54(5): 737-756. |
| [9] | YIN Changshuai, MENG Biao, LIANG Kang, CUI Hanwen, LIU Sheng, ZHANG Zhaofu. Comparative Study on Thermal Field of Ga2O3 Single Crystal Growth Simulated by Different Thermal Radiation Models [J]. Journal of Synthetic Crystals, 2025, 54(3): 386-395. |
| [10] | JIANG Bowen, JI Weiguo, ZHANG Lu, FAN Qiming, PAN Mingyan, HUANG Haotian, QI Hongji. Flow Field Symmetry of β-Ga2O3 Crystal Growth by EFG [J]. Journal of Synthetic Crystals, 2025, 54(3): 378-385. |
| [11] | LU Jiazheng, HU Runguang, ZHENG Lili, ZHANG Hui, HU Dongli. Defect Control of Polytype Inclusion in Large-Diameter SiC Single Crystal Grown by PVT Method [J]. Journal of Synthetic Crystals, 2025, 54(12): 2072-2082. |
| [12] | LU Zhengxuan, LI Chen, ZHOU Chao, LU Yuanhao, LI Haochao, KE Shanming, TONG Shukyin. Research Progress on the Epitaxial Growth of Cubic Silicon Carbide [J]. Journal of Synthetic Crystals, 2025, 54(12): 2037-2059. |
| [13] | XU Wanli, GAN Yunhai, LI Yuewen, LI Bin, ZHENG Youdou, ZHANG Rong, XIU Xiangqian. High Rate HVPE Growth of High Uniformity 6-Inch GaN Thick Film [J]. JOURNAL OF SYNTHETIC CRYSTALS, 2025, 54(1): 11-16. |
| [14] | LIN Haixin, GAO Dedong, WANG Shan, ZHANG Zhenzhong, AN Yan, ZHANG Wenyong. Multi-Physics Field Modeling and Optimization of Large-Size Czochralski Silicon Single Crystal Growth [J]. JOURNAL OF SYNTHETIC CRYSTALS, 2025, 54(1): 17-33. |
| [15] | CHENG Youliang, DU Huibin, ZHANG Zhongbao, WANG Kai. Optimization of Electronic Transport Model and Device Performance in Tin Dioxide-Based Dye-Sensitized Solar Cells [J]. JOURNAL OF SYNTHETIC CRYSTALS, 2024, 53(9): 1629-1639. |
| Viewed | ||||||
|
Full text |
|
|||||
|
Abstract |
|
|||||
E-mail Alert
RSS