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人工晶体学报 ›› 2025, Vol. 54 ›› Issue (3): 445-451.DOI: 10.16553/j.cnki.issn1000-985x.2024.0312

• 薄膜外延 • 上一篇    下一篇

新型亚氧化物化学气相传输工艺低成本生长β-Ga2O3厚膜

陈旭阳, 李昊勃, 秦华垚, 许明耀, 卢寅梅, 何云斌   

  1. 湖北大学材料科学与工程学院,武汉 430062
  • 收稿日期:2024-12-11 出版日期:2025-03-15 发布日期:2025-04-03
  • 通信作者: 何云斌,博士,教授。E-mail:ybhe@hubu.edu.cn; 何云斌,博士,湖北大学教授、博士生导师。2003年于德国李比希-吉森大学获得博士学位,主要从事宽禁带半导体材料与光电器件、氧化物表面物理与化学的研究。
  • 作者简介:陈旭阳(2000—),男,湖北省人,硕士研究生。E-mail:xuyangchen1229@126.com; 李昊勃(2002—),男,山西省人,硕士研究生。E-mail:3348672274@qq.com; 陈旭阳和李昊勃对本文具有同等贡献
  • 基金资助:
    国家自然科学基金(62274057,11975093,52202132);湖北省高等学校优秀中青年科技创新团队计划项目(T201901)

A Novel Suboxide Chemical Vapor Transport Technique for Cost-Effective Growth of β-Ga2O3 Thick Films

CHEN Xuyang, LI Haobo, QIN Huayao, XU Mingyao, LU Yinmei, HE Yunbin   

  1. School of Materials Science and Engineering, Hubei University, Wuhan 430062, China
  • Received:2024-12-11 Online:2025-03-15 Published:2025-04-03

摘要: β-Ga2O3作为一种超宽禁带半导体材料,在功率器件领域具有广阔的应用前景。本工作提出一种快速外延生长β-Ga2O3晶态厚膜的新方法——亚氧化物化学气相传输(SOCVT);该方法具有操作简单、设备价格低廉等优势。利用液态Ga和固态Ga2O3高温反应生成的气态Ga2O作Ga源,在常压的CO2气氛中,以设定温度1 300 ℃、坩埚-衬底间距8.5 cm的工艺条件,在c面蓝宝石单晶衬底(1 cm×1 cm)上获得了厚度超百微米的β-Ga2O3晶态厚膜。由XRD图谱分析可知,样品具有(201)择优取向。SEM表征结果显示所沉积厚膜均匀且致密,厚度达106.4 μm。XPS分析表明该厚膜的O与Ga的原子比为1.5,化学纯度高,不含碳杂质。由透射光谱测试推算其禁带宽度为4.42 eV。本研究表明,SOCVT技术具有较快的β-Ga2O3生长速度,有望发展成为低成本快速外延生长β-Ga2O3晶态厚膜的一种新方法。

关键词: 亚氧化物化学气相传输, β-Ga2O3, 厚膜, 低成本, 超宽禁带半导体

Abstract: As an ultra-wide bandgap semiconductor material, β-Ga2O3 has a broad application prospect in power devices. This work proposes a new method for fast epitaxial growth of crystalline β-Ga2O3 thick films: the suboxide chemical vapor transport (SOCVT), which has the advantages of simple operation and cost-effective. Using gaseous Ga2O generated by the high-temperature reaction of liquid Ga and solid Ga2O3 as the Ga source, the growth of a β-Ga2O3 crystalline film, thicker than 100 μm, on the c-plane sapphire single-crystal substrate (1 cm×1 cm) was achieved in the CO2 atmosphere at a setting temperature of 1 300 ℃ with the crucible-substrate spacing of 8.5 cm. According to the XRD analyses, the sample has a preferred orientation of (201). The SEM characterizations show that the deposited thick film is uniform and dense, with a thickness of 106.4 μm. XPS analyses reveal that the element O/Ga ratio of the thick film is 1.5, indicating its high chemical purity with no carbon-doping. The bandgap estimated from optical transmission spectrum is 4.42 eV. The research results indicate that the SOCVT technique offers a fast growth rate of β-Ga2O3, which is expected to become a new method for cost-effective and fast growth of crystalline β-Ga2O3 thick films.

Key words: suboxide chemical vapor transport, β-Ga2O3, thick film, cost-effective, ultra-wide bandgap semiconductor

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