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人工晶体学报 ›› 2025, Vol. 54 ›› Issue (3): 426-437.DOI: 10.16553/j.cnki.issn1000-985x.2024.0322

• 薄膜外延 • 上一篇    下一篇

双生长腔互联MOCVD外延生长氧化镓异质结构及其紫外光电探测器件的研究

王月飞, 高冲, 吴哲, 李炳生, 刘益春   

  1. 东北师范大学,紫外光发射材料与技术教育部重点实验室,长春 130024
  • 收稿日期:2024-12-23 出版日期:2025-03-15 发布日期:2025-04-03
  • 通信作者: 李炳生,博士,教授。E-mail:libs@nenu.edu.cn; 李炳生,东北师范大学物理学院教授。2002年于中国科学院长春光学精密机械与物理研究所获得凝聚态物理专业博士学位。先后在日本产业技术综合研究所、美国纽约城市大学、东京大学从事半导体薄膜外延及其光电子器件方面的研究。目前主要从事宽禁带半导体材料外延生长及其紫外光电探测器件制备研究。
  • 作者简介:王月飞(1992—),男,河北省人,博士,讲师。E-mail:wangyf@nenu.edu.cn
  • 基金资助:
    科技部重点研发计划(2019YFA0705202);国家自然科学基金(62274027,62404039);松山湖材料实验室开放研究基金(2023SLABFK03)

Study on the Epitaxial Growth of Gallium Oxide Heterostructure and UV Photodetector by Double Chamber Interconnected MOCVD

WANG Yuefei, GAO Chong, WU Zhe, LI Bingsheng, LIU Yichun   

  1. Key Laboratory of UV Light Emitting Materials and Technology, Ministry of Education, Northeast Normal University, Changchun 130024, China
  • Received:2024-12-23 Online:2025-03-15 Published:2025-04-03

摘要: 本文报道了利用氮化物-氧化物双生长腔互联金属有机化学气相沉积(MOCVD)系统外延生长氧化镓/氮化物薄膜异质结构并制备了高性能紫外光电探测器件。通过X射线衍射仪、原子力显微镜对不同衬底与不同缓冲层材料的薄膜结晶质量和表面形貌进行了表征;同时也利用光电测试系统对氧化镓平面和异质结型器件的紫外光电探测性能进行了研究。结果显示,AlN缓冲层的引入可以降低薄膜与衬底之间的晶格失配,有效提高了不同衬底外延氧化镓薄膜的结晶质量。利用双腔优势,分别在蓝宝石、p-Si(111)衬底上引入AlN缓冲层,获得具有(201)优选取向的高结晶质量的β-Ga2O3薄膜,显著提升了异质结日盲紫外光电探测器的器件性能。此外,还将β-Ga2O3与p型GaN结合制备了pn异质结构,研究了不同氧化层厚度对异质结光电探测性能的影响,最终制备了氧化镓基高性能紫外光电探测器件。

关键词: 氧化镓, 宽禁带半导体, 金属有机化学气相沉积, 外延生长, 异质结, 紫外光电探测

Abstract: This paper reports the epitaxial growth of Ga2O3/nitride thin film heterostructures using a nitrogen-oxide double chamber interconnected metal organic chemical vapor deposition (MOCVD) technique, achieving high-performance ultraviolet photodetector devices. The crystallization quality and surface morphology of the thin films were characterized using X-ray diffraction and atomic force microscopy for different substrates and buffer layer materials. Additionally, the ultraviolet photodetection performance of both planar and heterojunction Ga2O3 devices was studied using a photoelectric testing system. The results show that the introduction of an AlN buffer layer can reduce the lattice mismatch between the thin film and the substrate, effectively improving the crystallization quality of the epitaxial Ga2O3 thin films on different substrates. Utilizing the advantages of the double chamber, an AlN buffer layer on sapphire and p-Si (111) substrates was introduced respectively, resulting in β-Ga2O3 thin films with a preferred orientation of (201) and high structural quality, significantly enhancing the device performance of heterojunction blind ultraviolet photodetectors. Furthermore, we combined β-Ga2O3 with p-type GaN to fabricate a pn heterostructure and investigated the effect of different oxide layer thicknesses on the photodetection performance of the heterojunction. Ultimately, high-performance ultraviolet photodetector devices based on Ga2O3 were achieved.

Key words: β-Ga2O3, wide bandgap semiconductor, MOCVD, epitaxial growth, heterojunction, ultraviolet photoelectric detection

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